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SST29EE010 Datasheet(PDF) 17 Page - Silicon Storage Technology, Inc |
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SST29EE010 Datasheet(HTML) 17 Page - Silicon Storage Technology, Inc |
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17 / 26 page ![]() 17 © 2000 Silicon Storage Technology, Inc. 304-3 6/00 1 Megabit Page-Mode EEPROM SST29EE010 / SST29LE010 / SST29VE010 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 FIGURE 12: AC INPUT/OUTPUT REFERENCE WAVEFORMS FIGURE 13: A TEST LOAD EXAMPLE 304 ILL F13.0 TEST LOAD EXAMPLE TO TESTER TO DUT CL RL LOW RL HIGH VCC 304 ILL F12.1 REFERENCE POINTS OUTPUT INPUT VHT VLT VHT VLT VIHT VILT AC test inputs are driven at VIHT (2.4 V) for a logic “1” and VILT (0.4 V) for a logic “0”. Measurement reference points for inputs and outputs are VHT (2.0 V) and VLT (0.8 V). Inputs rise and fall times (10% « 90%) are <10 ns. Note: VHT–VHIGH Test VLT–VLOW Test VIHT–VINPUT HIGH Test VILT–VINPUT LOW Test |
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