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2002 Feb 27
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BCcomponents
Preliminary specification
Aluminum electrolytic capacitors SMD (Chip)
Long life base plate, very low impedance
150 CLZ
SPECIFIC TESTS AND REQUIREMENTS
General tests and requirements are specified in data handbook BC01, section “Tests and Requirements”.
Table 6
Test procedures and requirements
TEST
PROCEDURE
(quick reference)
REQUIREMENTS
NAME OF TEST
REFERENCE
Mounting
IEC 60384-18,
subclause 4.3
shall be performed prior to tests
mentioned below;
reflow soldering;
for maximum temperature load
refer to chapter “Mounting”
∆C/C: ±5%
tan
δ≤ spec. limit
IL2 ≤ spec. limit
Endurance
IEC 60384-18/
CECC32300,
subclause 4.15
Tamb = 105 °C; UR applied;
2000 hours
UR =6.3 V; ∆C/C: ±25%
UR ≥ 10 V; ∆C/C: ±20%
tan
δ≤ 2 × spec. limit
IL2 ≤ spec. limit
Useful life
CECC 30301,
subclause 1.8.1
Tamb = 105 °C; UR and IR applied;
case size
≤10 × 10 × 10: 2 500 hours
case size = 10
× 10 × 14: 3 000 hours,
∆C/C: ±50%
tan
δ≤ 3 × spec. limit
IL2 ≤ spec. limit
no short or open circuit
total failure percentage:
≤1%
Shelf life
(storage at high
temperature)
IEC 60384-18/
CECC32300,
subclause 4.17
Tamb = 105 °C; no voltage applied;
1000 hours
after test: UR to be applied for
30 minutes, 24 to 48 hours before
measurement
for requirements
see ‘Endurance test’ above