74AHC_AHCT1G08

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© NXP Semiconductors N.V. 2014. All rights reserved.

Product data sheet

Rev. 7 — 18 November 2014

6 of 12

NXP Semiconductors

74AHC1G08; 74AHCT1G08

2-input AND gate

12. Waveforms

Measurement points are given in Table 9.

Fig 5.

Input (A and B) to output (Y) propagation delays

Table 9.

Measurement point

Type

Input

Output

VI

VM

VM

74AHC1G08

GND to VCC

0.5

 V

CC

0.5

 V

CC

74AHCT1G08

GND to 3.0 V

1.5 V

0.5

 V

CC

Test data is given in Table 8. Definitions for test circuit:

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

Fig 6.

Test circuit for measuring switching times