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LTC3542 Datasheet(PDF) 11 Page - Analog Devices |
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LTC3542 Datasheet(HTML) 11 Page - Analog Devices |
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11 / 16 page ![]() LTC3542 11 3542fa The junction temperature, TJ, is given by: TJ = TA + TR where TA is the ambient temperature. As an example, consider the LTC3542 in dropout at an input voltage of 2.7V, a load current of 500mA and an ambient temperature of 70°C. From the typical performance graph of switch resistance, the RDS(ON) of the P-channel switch at 70°C is approximately 0.7 Ω. Therefore, power dissipated by the part is: PD = ILOAD2 • RDS(ON) = 175mW For the DFN package, the θJA is 102°C/W. Thus, the junc- tion temperature of the regulator is: TJ = 70°C + 0.175 • 102 = 87.9°C which is below the maximum junction temperature of 125°C. Notethatathighersupplyvoltages,thejunctiontemperature is lower due to reduced switch resistance (RDS(ON)). Checking Transient Response The regulator loop response can be checked by looking at the load transient response. Switching regulators take several cycles to respond to a step in load current. When a load step occurs, VOUT immediately shifts by an amount equal to ΔILOAD • ESR, where ESR is the effective series resistance of COUT. ΔILOAD also begins to charge or dis- charge COUT, generating a feedback error signal used by the regulator to return VOUT to its steady-state value. During this recovery time, VOUT can be monitored for overshoot or ringing that would indicate a stability problem. The output voltage settling behavior is related to the stability of the closed-loop system and will demonstrate the actual overall supply performance. For a detailed explanation of optimizing the compensation components, including a re- view of control loop theory, refer to Application Note 76. In some applications, a more severe transient can be caused by switching loads with large (>1μF) bypass capacitors. The discharged bypass capacitors are effectively put in APPLICATIONS INFORMATION 3) The switching current is MOSFET gate charging current, that results from switching the gate capacitance of the power MOSFETs. Each time a MOSFET gate is switched from low to high to low again, a packet of charge dQ moves from VIN to ground. The resulting dQ/dt is a current out of VIN that is typically much larger than the DC bias current. In continuous mode, IGATECHG = fO(QT + QB), where QT and QB are the gate charges of the internal top and bottom MOSFET switches. The gate charge losses are proportional to VIN and thus their effects will be more pronounced at higher supply voltages. Other “hidden” losses such as copper trace and internal battery resistances can account for additional efficiency degradations in portable systems. The internal battery and fuse resistance losses can be minimized by making sure that CIN has adequate charge storage and very low ESR at the switching frequency. Other losses include diode conduction losses during dead-time and inductor core losses generally account for less than 2% total ad- ditional loss. Thermal Considerations In most applications the LTC3542 does not dissipate much heat due to its high effi ciency. But in applications where the LTC3542 is running at high ambient temperature with low supply voltage and high duty cycles, such as in dropout, the heat dissipated may exceed the maximum junction temperature of the part. If the junction temperature reaches approximately 160°C, both power switches will be turned off and the SW node will become high impedance. To avoid the LTC3542 from exceeding the maximum junction temperature, the user need to do some thermal analysis. The goal of the thermal analysis is to determine whether the power dissipated exceeds the maximum junction temperature of the part. The temperature rise is given by: TR = (PD)(θJA) where PD is the power dissipated by the regulator and θJA is the thermal resistance from the junction of the die to the ambient. |
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