TMP302A

, TMP302B

TMP302C

, TMP302D

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE

PRODUCT

TRIP POINTS (°C)

PACKAGE-LEAD

DESIGNATOR

PACKAGE MARKING

TMP302A

50, 55, 60, 65

SOT563

DRL

OCP

TMP302B

70, 75, 80, 85

SOT563

DRL

OCT

TMP302C

90, 95, 100, 105

SOT563

DRL

OCR

TMP302D

110, 115, 120, 125

SOT563

DRL

OCS

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

TMP302A, TMP302B,

TMP302C, TMP302D

UNIT

Supply Voltage

+3.6

V

Input Pins, Voltage

V

Output Pin, Voltage

OUT

–0.5 to +3.6

V

Output Pin, Current

OUT

10

mA

Operating Temperature

–55 to +130

°C

Storage Temperature Range

–60 to +150

°C

Junction Temperature Range

+150

°C

Human Body Model (HBM)

2000

V

ESD Rating:

Charged-Device Model (CDM)

1000

V

Machine Model (MM)

200

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

2

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Product Folder Link(s): TMP302A TMP302B TMP302C TMP302D