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ATmega16A Datasheet(PDF) 244 Page - ATMEL Corporation |
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ATmega16A Datasheet(HTML) 244 Page - ATMEL Corporation |
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244 / 352 page  244 8154B–AVR–07/09 ATmega16A • In Normal mode, a dummy conversion (consisting of 10 comparisons) is performed when enabling the ADC. The user is advised to wait at least 200 ns after enabling the ADC before controlling/observing any ADC signal, or perform a dummy conversion before using the first result. • The DAC values must be stable at the midpoint value 0x200 when having the HOLD signal low (Sample mode). As an example, consider the task of verifying a 1.5V ± 5% input signal at ADC channel 3 when the power supply is 5.0V and AREF is externally connected to V CC. The recommended values from Table 24-6 are used unless other values are given in the algo- rithm in Table 24-7. Only the DAC and Port Pin values of the Scan-chain are shown. The column “Actions” describes what JTAG instruction to be used before filling the Boundary-scan Register with the succeeding columns. The verification should be done on the data scanned out when scanning in the data on the same row in the table. Using this algorithm, the timing constraint on the HOLD signal constrains the TCK clock fre- quency. As the algorithm keeps HOLD high for five steps, the TCK clock frequency has to be at least five times the number of scan bits divided by the maximum hold time, t hold,max. Table 24-7. Algorithm for Using the ADC Step Actions ADCEN DAC MUXEN HOLD PRECH PA3. Data PA3. Control PA3. Pullup_ Enable 1 SAMPLE_ PRELOAD 1 0x200 0x08 1 1 0 0 0 2 EXTEST 1 0x200 0x08 0 1 0 0 0 3 1 0x200 0x08 1 1 0 0 0 4 1 0x123 0x08 1 1 0 0 0 5 1 0x123 0x08 1 0 0 0 0 6 Verify the COMP bit scanned out to be 0 1 0x200 0x08 1 1 0 0 0 7 1 0x200 0x08 0 1 0 0 0 8 1 0x200 0x08 1 1 0 0 0 9 1 0x143 0x08 1 1 0 0 0 10 1 0x143 0x08 1 0 0 0 0 11 Verify the COMP bit scanned out to be 1 1 0x200 0x08 1 1 0 0 0 The lower limit is: 1024 1,5 V 0,95 5V ⁄ ⋅⋅ 291 0x123 == The upper limit is: 1024 1,5 V 1,05 5V ⁄ ⋅⋅ 323 0x143 == |
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