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ATmega16A Datasheet(PDF) 243 Page - ATMEL Corporation |
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ATmega16A Datasheet(HTML) 243 Page - ATMEL Corporation |
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243 / 352 page ![]() 243 8154B–AVR–07/09 ATmega16A Note: Incorrect setting of the switches in Figure 24-10 will make signal contention and may damage the part. There are several input choices to the S&H circuitry on the negative input of the output comparator in Figure 24-10. Make sure only one path is selected from either one ADC pin, Bandgap reference source, or Ground. If the ADC is not to be used during scan, the recommended input values from Table 24-6 should be used. The user is recommended not to use the Differential Gain stages during scan. Switch- cap based gain stages require fast operation and accurate timing which is difficult to obtain when used in a scan chain. Details concerning operations of the differential gain stage is there- fore not provided. The AVR ADC is based on the analog circuitry shown in Figure 24-10 with a successive approx- imation algorithm implemented in the digital logic. When used in Boundary-scan, the problem is usually to ensure that an applied analog voltage is measured within some limits. This can easily be done without running a successive approximation algorithm: apply the lower limit on the digi- tal DAC[9:0] lines, make sure the output from the comparator is low, then apply the upper limit on the digital DAC[9:0] lines, and verify the output from the comparator to be high. The ADC need not be used for pure connectivity testing, since all analog inputs are shared with a digital port pin as well. When using the ADC, remember the following: • The Port Pin for the ADC channel in use must be configured to be an input with pull-up disabled to avoid signal contention. MUXEN_3 Input Input Mux bit 3 0 0 MUXEN_2 Input Input Mux bit 2 0 0 MUXEN_1 Input Input Mux bit 1 0 0 MUXEN_0 Input Input Mux bit 0 1 1 NEGSEL_2 Input Input Mux for negative input for differential signal, bit 2 00 NEGSEL_1 Input Input Mux for negative input for differential signal, bit 1 00 NEGSEL_0 Input Input Mux for negative input for differential signal, bit 0 00 PASSEN Input Enable pass-gate of gain stages. 1 1 PRECH Input Precharge output latch of comparator. (Active low) 11 SCTEST Input Switch-cap TEST enable. Output from x10 gain stage send out to Port Pin having ADC_4 00 ST Input Output of gain stages will settle faster if this signal is high first two ACLK periods after AMPEN goes high. 00 VCCREN Input Selects Vcc as the ACC reference voltage. 00 Table 24-6. Boundary-scan Signals for the ADC (Continued) Signal Name Direction as Seen from the ADC Description Recommended Input when Not in Use Output Values when Recommended Inputs are used, and CPU is not Using the ADC |
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