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LTC3890 Datasheet(PDF) 18 Page - Linear Technology |
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LTC3890 Datasheet(HTML) 18 Page - Linear Technology |
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18 / 36 page ![]() LTC3890 18 3890f APPLICATIONS INFORMATION The peak-to-peak drive levels are set by the INTVCC voltage. This voltage is typically 5.1V during start-up (see EXTVCC Pin Connection). Consequently, logic-level threshold MOSFETs must be used in most applications. Pay close attention to the BVDSS specification for the MOSFETs as well. Selection criteria for the power MOSFETs include the on-resistance, RDS(ON), Miller capacitance, CMILLER, input voltage and maximum output current. Miller capacitance, CMILLER, can be approximated from the gate charge curve usually provided on the MOSFET manufacturers’ data sheet. CMILLER is equal to the increase in gate charge along the horizontal axis while the curve is approximately flat divided by the specified change in VDS. This result is then multiplied by the ratio of the application applied VDS to the gate charge curve specified VDS. When the IC is operating in continuous mode the duty cycles for the top and bottom MOSFETs are given by: Main Switch Duty Cycle V V Synchronous S OUT IN = w witch Duty Cycle VV V IN OUT IN = − The MOSFET power dissipations at maximum output current are given by: PMAIN = VOUT VIN IMAX () 2 1+ ()RDS(ON) + VIN () 2 IMAX 2 RDR () CMILLER () • 1 VINTVCC –VTHMIN + 1 VTHMIN f () PSYNC = VIN –VOUT VIN IMAX () 2 1+ ()RDS(ON) where δ is the temperature dependency of RDS(ON) and RDR (approximately 2Ω) is the effective driver resistance at the MOSFET’s Miller threshold voltage. VTHMIN is the typical MOSFET minimum threshold voltage. Both MOSFETs have I2R losses while the topside N-channel equation includes an additional term for transition losses, which are highest at high input voltages. For VIN < 20V the high current efficiency generally improves with larger MOSFETs, while for VIN > 20V the transition losses rapidly increase to the point that the use of a higher RDS(ON) device with lower CMILLER actually provides higher efficiency. The synchronous MOSFET losses are greatest at high input voltage when the top switch duty factor is low or during a short-circuit when the synchronous switch is on close to 100% of the period. The term (1+ δ) is generally given for a MOSFET in the form of a normalized RDS(ON) vs Temperature curve, but δ = 0.005/°C can be used as an approximation for low voltage MOSFETs. The optional Schottky diodes D3 and D4 shown in Figure 11 conduct during the dead-time between the conduction of the two power MOSFETs. This prevents the body diode of the bottom MOSFET from turning on, storing charge during the dead-time and requiring a reverse recovery period that could cost as much as 3% in efficiency at high VIN. A 1A to 3A Schottky is generally a good compromise for both regions of operation due to the relatively small average current. Larger diodes result in additional transition losses due to their larger junction capacitance. CIN and COUT Selection The selection of CIN is simplified by the 2-phase architec- ture and its impact on the worst-case RMS current drawn through the input network (battery/fuse/capacitor). It can be shown that the worst-case capacitor RMS current occurs when only one controller is operating. The controller with the highest (VOUT)(IOUT) product needs to be used in the formula shown in Equation 1 to determine the maximum |
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