WM2616

Production Data Rev 1.0

WOLFSON MICROELECTRONICS LTD

Production Data Rev 1.0 June 1999

2

PIN CONFIGURATION

1

2

3

4

NCS

DIN

SCLK

AGND

REFIN

FS

VDD

OUT

5

6

7

8

PIN DESCRIPTION

PIN NO

NAME

TYPE

DESCRIPTION

1

DIN

Digital input

Serial data input.

2

SCLK

Digital input

Serial clock input.

3

NCS

Digital input

Chip select. This pin is active low.

4

FS

Digital input

Frame synchronisation for serial input data.

5

AGND

Supply

Analogue ground.

6

REFIN

Analogue input

Voltage reference input.

7

OUT

Analogue output

DAC analogue output

8

VDD

Supply

Positive power supply.

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at or

beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to

damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of this

device.

CONDITION

MIN

MAX

Supply voltage, VDD to AGND

7V

Digital input voltage

-0.3V

VDD + 0.3V

Reference input voltage

-0.3V

VDD + 0.3V

WM2616CD

WM2616ID

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

VDD

2.7

5.5

V

High-level digital input voltage

VDD = 2.7V to 5.5V

2

V

Low-level digital input voltage

VDD = 2.7V to 5.5V

0.8

V

Reference voltage to REFIN

See Note

VDD - 1.5

V

Load resistance

2

10

k

Ω

Load capacitance

100

pF

Serial clock rate

20

MHz

WM2616CD

0

70

°C

Operating free-air temperature

WM2616ID

-40

85

°C

Note: Reference input voltages greater then VDD/2 will cause saturation for large DAC codes.