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LA2000M Datasheet(PDF) 3 Page - Sanyo Semicon Device |
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LA2000M Datasheet(HTML) 3 Page - Sanyo Semicon Device |
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3 / 7 page ![]() Test Circuit Test Conditions Test items Symbol SW-1 SW-2 SW-3 SW-4 Conditions Circuit current ICC 1113 Measure current flowing into pin 8 at VIN = −45 dB Output transistor saturation voltage VCE (sat) 2223 Measure VIN at pin 5 Output diode forward voltage VF 2421 Measure VIN at pin 5 Output-off level in input equivalent VIN 1113 Input level (v.v) when pin 5 turns over Comparator-on level VH 2313 Measure V3 when pin 5 turns over Comparator-off level VL 2313 Measure V3 when pin 5 turns over Pin 7 high level Vp-7 2413 Measure V2 at pin 7 Output transistor leakage current ITL 2433 Measure M3 Output diode leakage current IDL 2442 Measure M2 Sample Application Circuit 1 Unit (resistance: Ω, capacitance: F) Mechanism-coupled switch (OFF at play mode) Plunger Unit (resistance: Ω, capacitance: F) LA2000M No.4158-3/7 |
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