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LC66P516 Datasheet(PDF) 13 Page - Sanyo Semicon Device |
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LC66P516 Datasheet(HTML) 13 Page - Sanyo Semicon Device |
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13 / 25 page ![]() Electrical Characteristics at Ta = –30 to +70°C, VSS = 0 V, VDD = 3.0 to 5.5 V unless otherwise specified. No. 5483-13/25 LC662304A, 662306A, 662308A, 662312A, 662316A Parameter Symbol Conditions min typ max Unit Note P2, P3 (except for the P33/HOLD pin), IIH1 P61, and P63: VIN = 10.0 V, with the output 5.0 µA 1 Nch transistor off P0, P1, P4, P5, P6, PC, OSC1, RES, and Input high-level current IIH2 P33/HOLD (Does not apply to PD, PE, PC2, 1.0 µA 1 PC3, P61, and P63.): VIN = VDD, with the output Nch transistor off IIH3 PD, PE, PC2, PC3: VIN = VDD, 1.0 µA 1 with the output Nch transistor off IIL1 Input ports other than PD, PE, PC2, and PC3: –1.0 µA 2 Input low-level current VIN = VSS, with the output Nch transistor off IIL2 PC2, PC3, PD, PE: VIN = VSS, –1.0 µA 2 with the output Nch transistor off P2, P3 (except for the P33/HOLD pin), VDD – 1.0 Output high-level voltage VOH1 P6, and PC: IOH = –1 mA V3 P2, P3 (except for the P33/HOLD pin), VDD – 0.5 P6, and PC: IOH = –0.1 mA Value of the output pull-up resistor RPO P0, P1, P4, P5 30 100 150 kΩ 4 VOL1 P0, P1, P2, P3, P4, P5, P6, and PC 0.4 V Output low-level voltage (except for the P33/HOLD pin): IOL = 1.6 mA VOL2 P0, P1, P2, P3, P4, P5, P6, and PC 1.5 V (except for the P33/HOLD pin): IOL = 8 mA IOFF1 P2, P3, P61, P63: VIN = VDD 5.0 µA 5 Output off leakage current IOFF2 Does not apply to P2, P3, P61, and P63: 1.0 µA 5 VIN = VDD [Schmitt characteristics] Hysteresis voltage VHYS 0.1 VDD V High-level threshold voltage Vt H P2, P3, P5, P6, OSC1 (EXT), RES 0.5 VDD 0.8 VDD V Low-level threshold voltage Vt L 0.2 VDD 0.5 VDD V [Ceramic oscillator] Oscillator frequency fCF OSC1, OSC2: Figure 2, 4 MHz 4.0 MHz Oscillator stabilization time fCFS Figure 3, 4 MHz 10.0 ms [Serial clock] Cycle time Input tCKCY 0.9 µs Output 2.0 Tcyc Low-level and high-level Input tCKL 0.4 µs pulse widths Output tCKH 1.0 Tcyc Rise an fall times Output tCKR, tCKF 0.1 µs [Serial input] Data setup time tICK 0.3 µs Data hold time tCKI 0.3 µs [Serial output] SO0: With the timing of Figure 4 and the test Output delay time tCKO load of Figure 5. Stipulated with respect to the 0.3 µs falling edge ( ↓) of SCK0. SI0: With the timing of Figure 4. Stipulated with respect to the rising edge ( ↑) of SCK0. SCK0: With the timing of Figure 4 and the test load of Figure 5. Continued on next page. |
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