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HIP2123 Datasheet(PDF) 11 Page - Intersil Corporation |
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HIP2123 Datasheet(HTML) 11 Page - Intersil Corporation |
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11 / 16 page ![]() HIP2122, HIP2123 11 FN7670.0 December 23, 2011 Functional Description Functional Overview The HIP2122/23 have independent control inputs, LI and HI, for each output; LO and HO. When LI is low, LO is low and likewise, when HI is low, HO is low. The output negative transitions occur with minimal (and fixed) propagation delays. The positive transitions of each output are delayed by the programmed delay as set by RDT. With 80k, the delay is nominally 25ns. With 8k, the delay is nominally 220ns. Resistors values less than 8k and greater than 80k are not recommended. The delay time as a function of RDT is approximately tDT(ns) = 2/RDT. Delaying the rising edge but not the falling edge of each output is the technique that prevents shoot-thru. Please note that there is no logic that prevents both outputs from being on if both inputs are on simultaneously. The enable pin, EN, when low, drives both outputs to a low state. When the PWM input transitions, it is necessary to insure that both bridge FETS are not on at the same time to prevent shoot-through currents (break before make). The programmable dead time forces both outputs to be off before either of the bridge FETs is driven on. An 8kΩ resistor connected between RDT and VSS results in a nominal dead time of 250ns. An 80kΩ results with a minimum nominal dead time of 50ns. Resistors values less than 8k and greater than 80k are not recommended. Dead-time as a function of RDT is nominally tDT(ns) = 2/RDT. The high-side driver bias is established by the boot capacitor connected between HB and HS. The charge on the boot capacitor is provided by the internal boot diode that is connected to VDD. The current path to charge the boot capacitor occurs when the low-side bridge FET is on. This charge current is limited in amplitude by the inherent resistance of the boot diode and by the drain-source voltage of the low-side FET. Assuming that the on time of the low-side FET is sufficiently long to fully charge the boot capacitor, the boot voltage will charge very close to VDD (less the boot diode drop and the low-side FET on voltage). When the HI input transitions high, the high-side bridge FET is driven on after the delay time. Because the HS node is connected to the source of the high-side FET, the HS node will rise almost to the level of the bridge voltage (less the conduction voltage across the bridge FET). Because the boot capacitor voltage is referenced to the source voltage of the high-side FET, the HB node is VDD volts above the HS node and the boot diode is reversed biased. Because the high-side driver circuit is referenced to the HS node, the HO output is now approximately VHB + VBRIDGE above ground. During the low to high transition of the HS node, the boot capacitor sources the necessary gate charge to fully enhance the high-side bridge FET gate. After the gate is fully charged, the boot capacitor no longer sources the charge to the gate but continues to provide bias current to the high-side driver. It is clear that the charge of the boot capacitor must be substantially larger than the required charge of the high-side FET and high-side driver otherwise the boot voltage will sag excessively. If the boot capacitor value is too small for the required maximum of on-time of the high-side FET, the high-side UV lockout may engage resulting with an unexpected operation. Application Information Selecting the Boot Capacitor Value The boot capacitor value is chosen not only to supply the internal bias current of the high-side driver but also, and more significantly, to provide the gate charge of the driven FET without causing the boot voltage to sag excessively. In practice, the boot capacitor should have a total charge that is about 20 times the gate charge of the driven power FET for approximately a 5% drop in voltage after the charge has been transferred from the boot capacitor to the gate capacitance. The following parameters are required to calculate the value of the boot capacitor for a specific amount of voltage droop. In this example, the values used are arbitrary. They should be changed to comply with the actual application. The following equations calculate the total charge required for the Period. This equation assumes that all of the parameters are constant during the period duration. The error is insignificant if the ripple is small. VDD = 10V VDD can be any value between 7 and 14VDC VHB = VDD - 0.6V = VHO High side driver bias voltage (VDD - boot diode voltage) referenced to VHS Period = 1ms This is the longest expected switching period IHB = 100µA Worst case high side driver current when xHO = high (this value is specified for VDD = 12V but the error is not significant) RGS = 100kΩ Gate-source resistor (usually not needed) Ripple = 5% Desired ripple voltage on the boot capacitor (larger ripple is not recommended) Igate_leak = 100nA From the FET vendor’s datasheet Qgate80V = 64nC From Figure 21 FIGURE 21. TYPICAL GATE CHARGE OF A POWER FET 12 10 8 6 4 2 0 10 20 30 40 50 60 70 80 QG TOTAL GATE CHARGE (nC) 0 VDS = 80V VDS = 50V VDS = 20V ID = 33A |
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