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SST29SF010 Datasheet(PDF) 16 Page - Silicon Storage Technology, Inc

Part # SST29SF010
Description  512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Small-Sector Flash
PDF  24 Pages
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Manufacturer  SST [Silicon Storage Technology, Inc]
Direct Link  http://www.sst.com/
Logo SST - Silicon Storage Technology, Inc

SST29SF010 Datasheet(HTML) 16 Page - Silicon Storage Technology, Inc

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Preliminary Specifications
512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Small-Sector Flash
SST29SF512 / SST29SF010 / SST29SF020 / SST29SF040
SST29VF512 / SST29VF010 / SST29VF020 / SST29VF040
©2001 Silicon Storage Technology, Inc.
S71160-05-000
5/01
505
FIGURE 13: AC INPUT/OUTPUT REFERENCE WAVEFORMS FOR SST29SFXXX
FIGURE 14: AC INPUT/OUTPUT REFERENCE WAVEFORMS FOR SST29VFXXX
FIGURE 15: TEST LOAD EXAMPLES
505 ILL F11.0
REFERENCE POINTS
OUTPUT
INPUT
VIT
VIHT
VILT
VOT
AC test inputs are driven at VIHT (3.0 V) for a logic “1” and VILT (0 V) for a logic “0”. Measurement reference points for
inputs and outputs are VIT (1.5 VDD) and VOT (1.5 VDD). Input rise and fall times (10%
↔ 90%) are <10 ns.
Note: VIT - VINPUT Test
VOT - VOUTPUT Test
VIHT - VINPUT HIGH Test
VILT - VINPUT LOW Test
505 ILL F11.0
REFERENCE POINTS
OUTPUT
INPUT
VIT
VIHT
VILT
VOT
AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points
for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10%
↔ 90%) are <5 ns.
Note: VIT - VINPUT Test
VOT - VOUTPUT Test
VIHT - VINPUT HIGH Test
VILT - VINPUT LOW Test
505 ILL F12b.2
TO TESTER
TO DUT
CL
TEST LOAD EXAMPLE FOR SST29VF512/010/020/040
505 ILL F12.2
TEST LOAD EXAMPLE FOR SST29SF512/010/020/040
TO TESTER
TO DUT
CL
RL LOW
RL HIGH
VDD



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