AD678

REV. C

–5–

ORDERING GUIDE

Model

1

Package

Temperature Range

Tested and Specified

Package Option

2

AD678JN

28-Lead Plastic DIP

0

°C to +70°C

AC

N-28

AD678KN

28-Lead Plastic DIP

0

°C to +70°C

AC + DC

N-28

AD678JD

28-Lead Ceramic DIP

0

°C to +70°C

AC

D-28

AD678KD

28-Lead Ceramic DIP

0

°C to +70°C

AC + DC

D-28

AD678AD

28-Lead Ceramic DIP

–40

°C to +85°C

AC

D-28

AD678BD

28-Lead Ceramic DIP

–40

°C to +85°C

AC + DC

D-28

AD678AJ

44-Lead Ceramic JLCC

–40

°C to +85°C

AC

J-44

AD678BJ

44-Lead Ceramic JLCC

–40

°C to +85°C

AC + DC

J-44

AD678SD

28-Lead Ceramic DIP

–55

°C to +125°C

AC

D-28

AD678TD

28-Lead Ceramic DIP

–55

°C to +125°C

AC + DC

D-28

NOTES

ABSOLUTE MAXIMUM RATINGS*

With

Respect

Specification

To

Min

Max

Units

AGND

–0.3

+18

V

AGND

–18

+0.3

V

–0.3

+26.4

V

DGND

0

+7

V

AGND

DGND

–1

+1

V

AGND

V

Digital Inputs

DGND

–0.5

+7

V

Digital Outputs

DGND

–0.5

Max Junction

Temperature

175

°C

Operating Temperature

J and K Grades

0

+70

°C

A and B Grades

–40

+85

°C

S and T Grades

–55

+125

°C

Storage Temperature

–65

+150

°C

Lead Temperature

(10 sec max)

+300

°C

*Stresses above those listed under Absolute Maximum Ratings may cause perma-

nent damage to the device. This is a stress rating only; functional operation of the

device at these or any other conditions above those indicated in the operational

sections of this specification is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect device reliability.

ESD SENSITIVITY

The AD678 features input protection circuitry consisting of large “distributed” diodes and polysilicon

series resistors to dissipate both high energy discharges (Human Body Model) and fast, low energy

pulses (Charged Device Model). Per Method 3015.2 of MIL-STD-883C, the AD678 has been

classified as a Category 1 device.

Proper ESD precautions are strongly recommended to avoid functional damage or performance

degradation. Charges as high as 4000 volts readily accumulate on the human body and test equipment

and discharge without detection. Unused devices must be stored in conductive foam or shunts, and

the foam should be discharged to the destination socket before devices are removed. For further

information on ESD precautions, refer to Analog Devices’ ESD Prevention Manual.

AD678

CS

SC OE EOCEN SYNC 12/8 EOC

DB11

DB2

DB1

(R/

L)

DB0

(HBE)

DGND

OUTPUT

REGISTER

4-BIT FLASH

A/D

CONVERTER

CONTROL LOGIC

CONVERSION

LOGIC

SAMPLE/

HOLD

GAIN

STAGE

12-BIT D/A

CONVERTER

VOLTAGE

REF.

12

12

4

BIPOFF

AIN

AGND

Functional Block Diagram

WARNING!

ESD SENSITIVE DEVICE