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ADG802 Datasheet(PDF) 3 Page - Analog Devices |
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ADG802 Datasheet(HTML) 3 Page - Analog Devices |
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3 / 9 page ![]() –3– REV. PrE ADG801/ADG802 PRELIMINARY TECHNICAL DATA (VDD = 2.7 V to 3.6 V, VSS = GND = 0 V. All specifications –40°C to +125°C unless otherwise noted.) –40oC to –40oC to Parameter +25 oC +85 oC +125 oC Units Test Conditions/Comments ANALOG SWITCH Analog Signal Range 0 V to VDD V On Resistance (RON) 0.3 1 Ω typ VS = 0 V to VDD, IS = –10 mA; 0.7 0.8 Ω max Test Circuit 1 On-Resistance Flatness(RFLAT(ON)) 0.1 0.3 Ω typ VS = 0 V to VDD, IS = –10 mA LEAKAGE CURRENTS VDD = +3.3 V Source OFF Leakage IS (OFF) ±0.01 nA typ VS = 3 V/1 V, VD = 1 V/3 V; ±0.5 ±0.1 tbd nA max Test Circuit 2 Drain OFF Leakage ID (OFF) ±0.01 nA typ VS = 3 V/1 V, VD = 1 V/3 V; ±0.5 ±0.1 tbd nA max Test Circuit 2 Channel ON Leakage ID, IS (ON) ±0.01 nA typ VS = VD = 1 V, or 3 V; ±0.5 ±0.1 tbd nA max Test Circuit 3 DIGITAL INPUTS Input High Voltage, VINH 2.0 V min Input Low Voltage, VINL 0.4 V max Input Current IINL or IINH 0.005 µA typ VIN = VINL or VINH ±0.1 µA max CIN, Digital Input Capacitance 5 pF typ DYNAMIC CHARACTERISTICS 2 tON 50 ns typ RL = 50 Ω, C L = 35 pF TBD TBD ns max VS = 1.5 V, Test Circuit 4 tOFF 40 ns typ RL = 50 Ω, CL = 35 pF TBD TBD ns max VS = 1.5 V, Test Circuit 4 Charge Injection ±20 pC typ VS = 0 V, RS = 0 Ω, CL = 1 nF, Test Circuit 5 Off Isolation –65 dB typ RL = 50 Ω, C L = 5 pF, f = 1 MHz, Test Circuit 6 Bandwidth –3 dB 30 MHz typ RL = 50 Ω, CL = 5 pF, Test Circuit 7 CS (OFF) 55 pF typ f = 1 MHz CD (OFF) 55 pF typ f = 1 MHz CD, CS (ON) 110 pF typ f = 1 MHz POWER REQUIREMENTS VDD = +3.3 V I DD 0.001 µA typ Digital Inputs = 0 V or 3.3 V 1.0 µA max NOTES 1Temperature ranges are as follows: Extended Temperature Range: –40°C to +125°C. 2Guaranteed by design, not subject to production test. Specifications subject to change without notice. SPECIFICATIONS1 |
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