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28F256 Datasheet(PDF) 26 Page - Advanced Micro Devices

Part # 28F256
Description  256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory
PDF  35 Pages
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Manufacturer  AMD [Advanced Micro Devices]
Direct Link  http://www.amd.com
Logo AMD - Advanced Micro Devices

28F256 Datasheet(HTML) 26 Page - Advanced Micro Devices

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26
Am28F256
SWITCHING TEST WAVEFORMS
SWITCHING CHARACTERISTICS over operating range unless otherwise specified
AC Characteristics—Read Only Operation
Notes:
1. Guaranteed by design not tested.
2. Not 100% tested.
Parameter Symbols
Parameter Description
Am28F256 Speed Options
Unit
JEDEC
Standard
-70
-90
-120
-150
-200
tAVAV
tRC
Read Cycle Time (Note 2)
Min
70
90
120
150
200
ns
tELQV
tCE
Chip Enable AccessTime
Max
70
90
120
150
200
ns
tAVQV
tACC
Address Access Time
Max
70
90
120
150
200
ns
tGLQV
tOE
Output Enable Access Time
Max
35
35
50
55
55
ns
tELQX
tLZ
Chip Enable to Output in Low Z
(Note 2)
Min
0
00
00
ns
tEHQZ
tDF
Chip Disable to Output in High Z
(Note 1)
Max
2020
3035
35
ns
tGLQX
tOLZ
Output Enable to Output in Low Z
(Note 2)
Min
0
00
00
ns
tGHQZ
tDF
Output Disable to Output in High Z
(Note 2)
Max
2020
3035
35
ns
tAXQX
tOH
Output Hold from first of Address,
CE#, or OE# Change (Note 2)
Min
0
00
00
ns
tWHGL
Write Recovery Time before Read
Min
6
6
6
6
6
µs
tVCS
VCC Setup Time to Valid Read
(Note 2)
Min
5050
5050
50
µs
11560G-15
3 V
0 V
Input
Output
1.5 V
1.5 V
Test Points
AC Testing for -70 devices: Inputs are driven at 3.0 V for a
logic “1” and 0 V for a logic “0”. Input pulse rise and fall times
are
≤10 ns.
2.4 V
0.45 V
Input
Output
Test Points
2.0 V
2.0 V
0.8 V
0.8 V
AC Testing (all speed options except -70): Inputs are driven at
2.4 V for a logic “1” and 0.45 V for a logic “0”. Input pulse rise
and fall times are
≤10 ns.



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