| Electronic Components Datasheet Search |
|
ZR431 Datasheet(PDF) 3 Page - Diodes Incorporated |
|
|
|||||||||||||||||||||||||||||
ZR431 Datasheet(HTML) 3 Page - Diodes Incorporated |
|
3 / 9 page ![]() ZR431 ADJUSTABLE PRECISION ZENER SHUNT REGULATOR ZR431 Document number: DS33255 Rev. 6 - 2 3 of 9 www.diodes.com October 2011 © Diodes Incorporated DC Test Circuits Fig. 1 Test Circuit for VZ = VREF Fig. 2 Test Circuit for VZ > VREF Fig.3 Test Circuit for Off State Current Deviation of reference input voltage, VDEV, is defined as the maximum variation of the reference input voltage over the full temperature range. The average temperature coefficient of the reference input voltage, VREF is defined as: ) 2 T 1 T ( V 1000000 V ) C / ppm ( V ref dev o ref − × = The dynamic output impedance, RZ is defined as: z z z I V R Δ Δ = When the device is programmed with two external resistors, R1 and R2, (Fig 2), the dynamic output impedance of the overall circuit, R’, is defined as: ) 2 R 1 R 1 ( R R z + = ′ Input I L I REF I Z V Z V REF Input I L I REF I Z V Z V REF R1 R2 Input I ZOFF V Z T1 T2 Temperature V = V - V DEV MAX MIN V MAX V MIN |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |