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W216 Datasheet(PDF) 12 Page - Cypress Semiconductor

Part # W216
Description  Spread Spectrum FTG for 440BX and VIA Apollo Pro-133
PDF  14 Pages
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

W216 Datasheet(HTML) 12 Page - Cypress Semiconductor

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W216
PRELIMINARY
12
SDRAM 0:15,_F Clock Outputs (Lump Capacitance Test Load = 22 pF)
Parameter
Description
Test Condition/
Comments
SDRAMIN =
66.8 MHz
SDRAMIN =
100 MHz
SDRAMIN =
133 MHz
Unit
Min.
Typ.
Max.
Min.
Typ.
Max.
Min.
Typ. Max.
tP
Period
Measured on rising edge
at 1.5V
15
15.5
10
10.5
7.5
8.0
ns
tH
High Time
Duration of clock cycle
above 2.4V
5.2
3.0
1.87
ns
tL
Low Time
Duration of clock cycle
below 0.4V
5.0
2.0
1.67
ns
tR
Output Rise
Edge Rate
Measured from 0.4V to
2.4V
14
14
14
V/ns
tF
Output Fall Edge
Rate
Measured from 2.4V to
0.4V
14
14
14
V/ns
tD
Duty Cycle
Measured on rising and
falling edge at 1.5V
45
55
45
55
45
55
%
tSK
Output Skew
Measured on rising and
falling edge at 1.5V
250
250
250
ps
tPD
Propagation
Delay
Measured from SDRAMIN
3.7
3.7
3.7
ns
Zo
AC Output
Impedance
Average value during
switching transition. Used
for determining series ter-
mination value.
15
15
15
Ω
48-MHz Clock Output (Lump Capacitance Test Load = 20 pF)
Parameter
Description
Test Condition/Comments
Min.
Typ.
Max.
Unit
f
Frequency, Actual
Determined by PLL divider ratio (see m/n below)
48.008
MHz
fD
Deviation from 48 MHz
(48.008 – 48)/48
+167
ppm
m/n
PLL Ratio
(14.31818 MHz x 57/17 = 48.008 MHz)
57/17
tR
Output Rise Edge Rate
Measured from 0.4V to 2.4V
0.5
2
V/ns
tF
Output Fall Edge Rate
Measured from 2.4V to 0.4V
0.5
2
V/ns
tD
Duty Cycle
Measured on rising and falling edge at 1.5V
45
55
%
fST
Frequency Stabilization
from Power-up (cold start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to fre-
quency stabilization.
3ms
Zo
AC Output Impedance
Average value during switching transition. Used
for determining series termination value.
25
Ω



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