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HCPL7820 Datasheet(PDF) 8 Page - Agilent(Hewlett-Packard) |
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HCPL7820 Datasheet(HTML) 8 Page - Agilent(Hewlett-Packard) |
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8 / 15 page  1-240 Notes: 1. HP recommends the use of non- chlorine activated fluxes. 2. If VIN- is brought above VDD1-2 V with respect to GND1 an internal test mode may be activated. This test mode is not intended for customer use. 3. Exact offset value is dependent on layout of external bypass capacitors. The offset value in the data sheet corresponds to HP’s recommended layout (see Figures 26 and 27). 4. Data sheet value is the average magnitude of the difference in offset voltage from TA = 25°C to TA = 100°C, expressed in microvolts per °C. 5. Nonlinearity is defined as half of the peak-to-peak deviation from the best- fit gain line, expressed as a percentage of the full-scale differential output voltage. 6. Because of the switched-capacitor nature of the input sigma-delta A/D converter, time-averaged values are shown. 7. When the differential input signal exceeds approximately 320 mV, the outputs will limit at the typical values shown. 8. Short-circuit current is the amount of output current generated when either output is shorted to VDD2 or ground. 9. IMR (also known as CMR or Common Mode Rejection) specifies the mini- mum rate of rise of an isolation mode noise signal at which small output perturbations begin to appear. These output perturbations can occur with both the rising and falling edges of the isolation mode waveform and may be of either polarity. A CMR failure is defined as a perturbation exceeding 200 mV at the output of the recom- mended application circuit (Figure 24). See applications section for more information on CMR. 10. IMRR is defined as the ratio of differential signal gain (signal applied differentially between pins 2 and 3) to the isolation mode gain (input pins tied to pin 4 and the signal applied between the input and the output of the isolation amplifier) at 60 Hz, expressed in dB. 11. Output noise comes from two primary sources: chopper noise and sigma- delta quantization noise. Chopper noise results from chopper stabiliza- tion of the output op-amps. It occurs at a specific frequency (typically 500 kHz) and is not attenuated by the on-chip output filter. The on-chip filter does eliminate most, but not all, of the sigma-delta quantization noise. An external filter circuit may be easily added to the external post-amplifier to reduce the total RMS output noise. See applications section for more information. 12. Data sheet value is the amplitude of the transient at the differential output of the HCPL-7820/7825 when a 1 Vp-p, 1 MHz square wave with 200 ns rise and fall times (measured at pins 1 and 8) is applied to both VDD1 and VDD2. 13. This is a two-terminal measurement: pins 1-4 are shorted together and pins 5-8 are shorted together. 14. In accordance with UL 1577, for devices with minimum VISO specified at 3750 V rms, each optocoupler is proof-tested by applying an insulation test voltage greater than 4500 V rms for one second (leakage current detection limit II-O < 5 µA). This test is performed before the method b, 100% production test for partial discharge shown in the VDE 0884 Insulation Characteristics Table. |
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