HIP7020AP datasheet(4/11 Pages) INTERSIL

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Bus Emissions Voltage Output

VdB_LIMIT

-60

dBV

BUS OUT Leakage Currents

IBO_LEAK

Battery Low/Off1

≤ VBUS OUT ≤ 20V; 0V ≤ VBATT ≤ 0.8V;

-0.3V

≤ VTX ≤ 7V

-10

µA

Battery Low/Off2

-20V

≤ VBUS OUT ≤ 0V; 0V ≤ VBATT ≤ 0.8V;

-0.3V

≤ VTX ≤ 7V

-100

µA

Bus High

VBOH < VBUS OUT ≤ 20V; 6V ≤ VBATT ≤ 16V;

≤ VTX ≤ 7V

-10

µA

TX Low1

≤ VBUS OUT ≤ 20V; 6V ≤ VBATT ≤ 16V;

-0.3V

≤ VTX ≤ 0.8V

-10

µA

TX Low2

-20V

≤ VBUS OUT < 0V; 9.5V ≤ VBATT ≤ 16V;

-0.3V

≤ VTX ≤ 0.8V

-3000

µA

With Loss of Ground1 (Note 11)

VGND ≤ VBUS OUT < 20V; 0V ≤ VBATT ≤ 16V;

-0.3V

≤ VTX ≤ 7V; 0V ≤ (VBATT - VGND) ≤ 0.8V

-10

µA

With Loss of Ground2 (Note 11)

-20V

≤ VBUS OUT ≤ VGND; 0V ≤ VBATT ≤ 16V;

-0.3V

≤ VTX ≤ 7V; 0V ≤ (VBATT - VGND) ≤ 0.8V

-100

µA

TX to BUS OUT Propagation

Delays

tDTXHBO,

tDTXLBO

RS = 56.2kΩ; VBUS OUT = 3.875V (Note 8)

µs

BUS OUT Transition Times,

Rise and Fall

tr, tf

RS = 56.2kΩ; Measured on BUS OUT between 1.5V

and 6.25V (Note 8)

µs

BUS OUT Noise Rejection

fR = 30Hz to 250kHz; VBATT to BUS OUT

BUS OUT RF Isolation

fI = 0.25MHz to 200MHz; VBATT to BUS OUT

BUS IN

Input Threshold Voltage

VBIH

3.6

4.15

Input Bias Current

IBIN

-20V

≤ VBUS IN ≤ 20V

-5

µA

Input Capacitance

CBIN

RX OUTPUT

Output Voltage, Low

VIL

IRX = 1.6mA

0.01

0.4

Output Current

IRX

VRX = 5V (Note 10)

Output Leakage Current

I RX(LK)

VRX = 5V, RD = 10kΩ; VBUSIN Low

-10

µA

Receive Propagation Delay

tDRXON,

tDRXOFF

Measured from BUS IN Threshold Voltage

µs

LB EN CMOS/TTL INPUT WITH/PULL DOWN

Input Low Voltage

VIL

0.8

Input High Voltage

VIH

2.0

Input Bias Current

ILB

VLB = 7V; (Note 9)

µA

TX To RX Turn ON, OFF;

Delay In Loop-Back Mode

tDLBON,

tDLBOFF

VLB Low; Toggle TX; Meas. RX

µs

LB EN Turn ON, OFF;

TX to BUS OUT

tD(LH),

tD(HL)

VTX High; Toggle LB EN; Meas. BUS OUT

µs

NOTES:

5. In the operating voltage range from 6V to 8.5V the BUS OUT, VBOH is limited by the low power supply. In the operating voltage range

from 16V to 24V the maximum bus load is limited by the package power dissipation ratings.

6. Over-temperature shutdown with hysteresis is incorporated to protect the IC under system failure conditions.

7. Measured Current into the TX terminal is determined by Pull-Down Current Sink.

8. Propagation Delay limits are measured at the 3.875V level on BUS OUT. Rise and Fall Times are measured between 1.5V and 6.25V on

the BUS OUT terminal.

9. Measured Current into the LB EN terminal is determined by Pull-Down Current Sink.

10. The IRX Output Current test parameter defines Short Circuit protection limits.

11. Loss of Ground refers to loss of module (node) Ground which results in a voltage between the Battery and IC Ground of less than 0.8V.

For voltage between Battery and Ground above 0.8V, the Transceiver Bus Output may become active. The module circuit in Figure 3 is

used to measure the Loss of Ground leakage.

12. Unless otherwise noted, all Electrical Specification test conditions are as shown in Figure 4.

13. The lower limit is 6.6V or VBATT - 1.7V, whichever is less.

Electrical Speciﬁcations

9.0V

≤ V

BATT ≤ 16V; RS = 56.2kΩ±1%; except as noted, RBS = 500Ω to 1500Ω and τ =RBSCBS =5µs.

All voltages are measured with respect to ground and the TA Range of -40

oC to 125oC shall not be

exceeded during test unless otherwise speciﬁed. For test detail, refer to the Block Diagram, Figures 3

and 4 Test Circuits and Figures 5 and 6 Waveforms. (Continued)

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNITS

HIP7020

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