RH1084

3

rh1084fd

Information furnished by Linear Technology Corporation is believed to be accurate and reliable.

However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-

tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.

TABLE 1A: ELECTRICAL CHARACTERISTICS

TABLE 1A: ELECTRICAL CHARACTERISTICS

Note 1: See thermal regulation specifications for changes in output voltage

due to heating effects. Line and load regulation are measured at a constant

junction temperature by low duty cycle pulse testing.

Note 2: Line and load regulation are guaranteed up to the maximum

power dissipation of 45W for RH1084. Power dissipation is determined

by the input/output differential voltage and the output current. Guaranteed

maximum power dissipation will not be available over the full input/output

voltage range.

PARAMETER

CONDITIONS

10KRAD(Si)

20KRAD(Si)

50KRAD(Si)

100KRAD(Si)

200KRAD(Si)

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

UNITS

Reference Voltage (Note 5)

1.234 1.258

1.23

1.257 1.225 1.253

1.22

1.247 1.205 1.241

V

1.22

1.275 1.219 1.275 1.215 1.275 1.210 1.275 1.203 1.275

V

Line Regulation (Notes 1, 2)

0.2

0.5

0.21

0.5

0.23

0.5

0.25

0.5

0.3

0.5

%

%

0.6

0.6

0.6

0.7

0.8

%

Dropout Voltage (Note 3)

1.5

1.55

1.65

1.8

2.0

V

Current Limit

5.5

0.3

5.5

0.3

5.4

0.3

5.25

0.3

5.0

0.3

A

A

Minimum Load Current

10

10

10

10

10

mA

Adjust Pin Current

120

120

120

120

120

μA

Adjust Pin Current Change

(Note 5)

55555

μA

Note 3: Dropout voltage is specified over the full output current range of

the device. Test points and limits are shown on the Dropout Voltage curve

in the LT

Note 4: Guaranteed by design, characterization, or correlation to other

tested parameters.

data sheet. For compliance with 883 revision C current density

specifications, the RH1084 is rated to 3A.

MIL-STD-883 TEST REQUIREMENTS

SUBGROUP

Final Electrical Test Requirements (Method 5004)

1*,2,3,4,5,6

Group A Test Requirements (Method 5005)

1,2,3,4,5,6

Group C and D End Point Electrical Parameters

(Method 5005)

1

* PDA Applies to subgroup 1. See PDA Test Notes.

PDA Test Notes

The PDA is specified as 5% based on failures from group A, subgroup 1,

tests after cooldown in accordance with method 5004 of MIL-STD-883

Class B. The verified failures of group A, subgroup 1, after burn-in divided

by the total number of devices submitted for burn-in in that lot shall be

used to determine the percent defective for the lot.

Linear Technology Corporation reserves the right to test to tighter limits

than those given.