AN2482 datasheet(13/18 Pages) STMICROELECTRONICS

13 / 18 page

AN2482

Electromagnetic compatibility (EMC) requirements

13/18

Table 2.

PCLT Immunity tests results

Minimum requirements of

international standards

Robustness of the PCLT demo board

Test conditions

Levels

Tests conditions

Levels

behavior of the

PCLT

ESD test

IEC61000-4-2

Air discharge

±8 kV

RC = 2.2 kΩ

RIN = 750 Ω

±15 kV

No failure,

no disturbance.

Contact discharge

±4 kV

RC = 2.2 kΩ

RIN = 750 Ω

±8 kV

Burst test

IEC61000-4-4

Analog Input

±1kV

RIN = 750 Ω C

IN = 22 nF

CC =33 nF

±4 kV

No failure,

no disturbance.

DC power line

±2 kV

RC = 2.2 kΩ

Surge test

IEC61000-4-5

Analog

Input

Ω: 0.5 µF

differential and

common mode

±0.5 kV

Analog

Input

RIN = 750 Ω

±0.5 kV

No failure,

temporary

disturbance.

RIN = 1.2 kΩ

±1 kV

dc power

line

Ω; 18 µF

differential

mode

±0.5 kV

dc power

line

RC = 2.2 k

±1 kV

Ω; 9 µF

common mode

±1 kV

Conducted

disturbance test

IEC61000-4-6

150 kHz

to 80 MHz

22 nF

capacitors

3 Vrms

AM±80%

150 kHz to

80 MHz

RIN = 750 Ω

C = 22 nF

At the input

10 Vrms

AM±80%

No failure,

No disturbance.

Reverse input

polarity test

-Vcc applied to one input during 10 s

-30 Vdc applied to one input,

+30 Vdc on the others

No failure

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