6

RH1078M

TABLE 2: ELECTRICAL TEST REQUIRE E TS

MIL-STD-883 TEST REQUIREMENTS

SUBGROUP

Final Electrical Test Requirements (Method 5004)

1*,2,3,4,5,6

Group A Test Requirements (Method 5005)

1,2,3,4,5,6

Group C and D End Point Electrical Parameters

1,2,3

(Method 5005)

* PDA Applies to subgroup 1. See PDA Test Notes.

PDA Test Notes

The PDA is specified as 5% based on failures from group A, subgroup 1, tests

after cooldown as the final electrical test in accordance with method 5004 of

MIL-STD-883 Class B. The verified failures of group A, subgroup 1, after burn-

in divided by the total number of devices submitted for burn-in in that lot shall

be used to determine the percent for the lot.

Linear Technology Corporation reserves the right to test to tighter limits than

those given.

TOTAL DOSE-KRADs (Si)

1

0

500

1000

10

100

1000

1078M • G1

–500

–250

250

750

–750

–1000

Input Offset Voltage

TOTAL DOSE-KRADs (Si)

1

0

10

20

10

100

1000

1078M • G2

–10

–5

5

15

–15

–20

Input Offset Current

Common-Mode Rejection Ratio

TOTAL DOSE-KRADs (Si)

1

110

120

130

10

100

1000

1078M • G4

100

90

TOTAL DOSE-KRADs (Si)

1

–80

–40

0

10

100

1000

1078M • G3

–120

–100

–60

–20

–140

–160

Input Bias Current