LP3997

Enable

DELAY

Error/POR

SD

SENSE

ERROR

2.2 PF

2.2 PF

470k

GND

1

7

6

5

4

8

2

3

0.1 PF

0.1 PF

LP3997

www.ti.com

SNVS272B – MAY 2004 – REVISED MAY 2013

Micropower 250-mA CMOS LDO Regulator With Error Flag and Power-On-Reset

Check for Samples: LP3997

1

FEATURES

DESCRIPTION

The LP3997 regulator is designed to meet the

2

•

Low 140-mV Dropout at 250-mA Load

requirements of portable, battery-powered systems,

•

Stable With Ceramic Capacitor.

providing accurate output voltage, low noise, and low

•

Low Noise With Bypass Capacitor

quiescent current. The LP3997 provides 3.3V output

at up to 250mA load current. The chip architecture is

•

capable of providing output voltages as low as 0.8V.

•

When switched in shutdown mode, the power

•

Thermal and Short Circuit Protection

consumption is virtually zero.

•

The LP3997 is designed to be stable with space

•

saving ceramic output capacitor as small as 1µF.

The LP3997 also includes an out-of-regulation error

APPLICATIONS

flag. When the output is more than 5% below its

•

Portable Consumer Electronics

nominal voltage, the error flag sets to low. If a

capacitor is connected to device’s delay pin, a

•

Cellular Handsets

delayed power-on reset signal will be generated.

•

Laptop and Palm Computers

•

PDAs

•

Digital Cameras

(1)

For other voltage options, contact your TI sales office

(2)

For other package options, contact your TI sales office.

Typical Application Circuit

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 2004–2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.