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LM3677 Datasheet(PDF) 2 Page - Texas Instruments |
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LM3677 Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 28 page ![]() 6 GND TOP VIEW SW 2 EN 3 BOTTOM VIEW VIN 1 5 SW 4 FB 6 GND 5 SW 4 FB VIN 1 SW 2 EN 3 Top View Bottom View A1 A3 Vin EN FB SW GND Vin EN GND SW FB C1 C3 B2 A3 A1 C3 C1 B2 LM3677 SNVS502F – MARCH 2007 – REVISED MAY 2013 www.ti.com DESCRIPTION (CONTINUED) The device offers superior features and performance for mobile phones and similar portable applications with complex power management systems. Automatic intelligent switching between PWM low-noise and PFM low- current mode offers improved system control. During PWM mode operation, the device operates at a fixed frequency of 3 MHz (typ). PWM mode drives loads from ~ 80 mA to 600 mA max. Hysteretic PFM mode extends the battery life by reducing the quiescent current to 16 µA (typ.) during light load and standby operation. Internal synchronous rectification provides high efficiency. In shutdown mode (Enable pin pulled down), the device turns off and reduces battery consumption to 0.01 µA (typ.). The LM3677 is available in a lead-free (NOPB) 5-bump DSBGA package and 6-pin USON package. A switching frequency of 3 MHz (typ.) allows use of tiny surface-mount components. Only three external surface-mount components, an inductor and two ceramic capacitors, are required. CONNECTION DIAGRAMS 5-Bump DSBGA Package See Package Number YZR0005 6-Pin USON Package See Package Number NGE0006A PIN DESCRIPTIONS(1) Name Pin No. Description VIN A1 1 Power supply input. Connect to the input filter capacitor (Figure 1). GND A3 6 Ground pin. EN C1 3 Enable pin. The device is in shutdown mode when voltage to this pin is < 0.4V and enabled when > 1.0V. Do not leave this pin floating. FB C3 4 Feedback analog input. Connect directly to the output filter capacitor ( FIGURE 1). SW B2 2, 5 Switching node connection to the internal PFET switch and NFET synchronous rectifier. (1) For output voltage 1.2V or lower, input voltage needs to be derated to the range of 2.7V to 5.0V in order to perform within specification. These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 2 Submit Documentation Feedback Copyright © 2007–2013, Texas Instruments Incorporated Product Folder Links: LM3677 |
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