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100328F Datasheet(PDF) 8 Page - National Semiconductor (TI) |
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100328F Datasheet(HTML) 8 Page - National Semiconductor (TI) |
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8 / 12 page ![]() Test Circuitry (ECL-to-TTL) Switching Waveforms (ECL-to-TTL) DS100295-10 Note 20: Rt =50Ω termination. When an input or output is being monitored by a scope, Rt is supplied by the scope’s 50Ω resistance. When an input or output is not being monitored, an external 50 Ω resistance must be applied to serve as Rt. Note 21: The TTL TRI-STATE pull up switch is connected to +7V only for ZL and LZ tests. Note 22: TTL and ECL force signals are brought to the DUT via 50 Ω coax lines. Note 23: VTTL is decoupled to ground with 0.1 µF, VEE is decoupled to ground with 0.01 µF and VCC is connected to ground. FIGURE 3. ECL-to-TTL AC Test Circuit DS100295-11 Note 24: DIR is LOW, and OE is HIGH FIGURE 4. ECL-to-TTL Transition — Propagation Delay and Transition Times www.national.com 8 |
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