 |
Electronic Components Datasheet Search |
|
|
Electronic Components Datasheet Search |
|
100329F Datasheet(PDF) 7 Page - National Semiconductor (TI) |
|
|
|
|||||||||||||||||||||||||||||
100329F Datasheet(HTML) 7 Page - National Semiconductor (TI) |
|
|
7 / 11 page  Test Circuitry (TTL-to-ECL) Switching Waveforms (TTL-to-ECL) DS100306-7 Note 15: RT = 50Ω termination resistive load. When an input or output is being monitored by a scope, RTis supplied by the scope’s 50Ω input resistance. When an input or output is not being monitored, an external 50 Ω resistance must be applied to serve as RT. Note 16: TTL and ECL force signals are brought to the DUT via 50 Ω coax lines. Note 17: VTTL is decoupled to ground with 0.1 µF, VEE is decoupled to ground with 0.01 µF and VCC is connected to ground. FIGURE 1. TTL-to-ECL AC Test Circuit DS100306-9 FIGURE 2. TTL to ECL Transition — Propagation Delay and Transition Times www.national.com 7 |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
English ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
