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TAS5756M Datasheet(PDF) 8 Page - Texas Instruments |
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TAS5756M Datasheet(HTML) 8 Page - Texas Instruments |
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8 / 104 page ![]() 28 V ESD SPK_FAULT 100 Ÿ TAS5756M SLAS988B – JUNE 2014 – REVISED AUGUST 2015 www.ti.com Internal Pin Configurations (continued) Figure 17. SPK_FAULT Pin 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT Low-voltage digital, analog, charge pump DVDD, AVDD, CPVDD –0.3 3.9 V supply PVDD supply PVDD –0.3 30 V Input voltage for SPK_GAIN/FREQ and VI(AmpCtrl) –0.3 VGVDD + 0.3 V SPK_FAULT pins DVDD referenced digital inputs(2) VI(DigIn) –0.5 VDVDD + 0.5 V Analog input into speaker amplifier VI(SPK_INxx) –0.3 6.3 V Voltage at speaker output pins VI(SPK_OUTxx) –0.3 32 V Ambient operating temperature, TA –25 85 °C Storage temperature, Tstg –40 125 °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) DVDD referenced digital pins include: ADR0, ADR1, GPIO0, GPIO1, GPIO2, LRCK/FS, MCLK, SCL, SCLK, SDA, SDIN, and SPK_MUTE. 7.2 ESD Ratings VALUE UNIT Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 Electrostatic V(ESD) V discharge Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±500 (1) JEDEC document JEP155 states that 2000-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 500-V CDM allows safe manufacturing with a standard ESD control process. 8 Submit Documentation Feedback Copyright © 2014–2015, Texas Instruments Incorporated Product Folder Links: TAS5756M |
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