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CLC410 Datasheet(PDF) 2 Page - Texas Instruments

Part # CLC410
Description  Fast Settling, Video Op Amp
PDF  16 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

CLC410 Datasheet(HTML) 2 Page - Texas Instruments

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OBSOLETE
CLC410
SNOS854D – AUGUST 2000 – REVISED APRIL 2013
www.ti.com
CONNECTION DIAGRAM
Figure 3. Pinout
PDIP & SOIC
See Package Numbers P and D
Figure 2. Non-Inverting Frequency Response
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ABSOLUTE MAXIMUM RATINGS
(1) (2)
Supply Voltage (VCC)
±7V
IOUT
Output is short circuit protected to ground, but maximum
reliability will be maintained if IOUT does not exceed...
60mA
Common Mode Input Voltage
±VCC
Differential Input Voltage
5V
Disable Input Voltage (pin 8)
±VCC−1V
Applied output voltage when disabled
±VCC
Junction Temperature
+150°C
Operating Temperature Range
−40°C to +85°C
Storage Temperature Range
−65°C to +150°C
Lead Solder Duration (+300°C)
10 sec
ESD Rating (human body model)
500V
(1)
“Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be ensured. They are not meant to imply
that the devices should be operated at these limits. The table of ELECTRICAL CHARACTERISTICS specifies conditions of device
operation.
(2)
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
OPERATING RATINGS
Thermal Resistance
Package
(
θJC)
(
θJA)
PDIP
65°C/W
120°C/W
SOIC
60°C/W
140°C/W
ELECTRICAL CHARACTERISTICS
AV = +2, VCC = ±5V, RL = 100Ω, Rf = 250Ω; unless specified
Symbol
Parameter
Conditions
Typ
Max/Min(1)
Units
Ambient Temperature
CLC410AJ
+25°C
−40°C
+25°C
+85°C
Frequency Domain Response
SSBW
-3dB Bandwidth
VOUT <0.5VPP
200
>150
>150
>120
MHz
LSBW
VOUT <5VPP,
50
>35
>35
>35
MHz
AV = +5
(1)
Min/max ratings are based on product characterization and simulation. Individual parameters are tested as noted. Outgoing quality
levels are determined from tested parameters.
2
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Copyright © 2000–2013, Texas Instruments Incorporated
Product Folder Links: CLC410



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