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ADC0811 Datasheet(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # ADC0811
Description  8-Bit Serial I/O A/D Converter With 11-Channel Multiplexer
PDF  14 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

ADC0811 Datasheet(HTML) 4 Page - National Semiconductor (TI)

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Electrical Characteristics
The following specifications apply for VCC e 475V to 525V VREF ea46V to (VCC a 01V) w2 CLK e 2097 MHz unless
otherwise specified Boldface limits apply from TMIN to TMAX all other limits TA e TJ e 25 C (Continued)
Typical
Tested
Design
Parameter
Conditions
(Note 6)
Limit
Limit
Units
(Note 7)
(Note 8)
AC CHARACTERISTICS
(Continued)
tSDI Minimum DI Set-up Time to SCLK
200
400
ns
Rising Edge
tDDO Maximum Delay From SCLK
RLe30k
180
400
400
ns
Falling Edge to DO Data Valid
CLe100 pF
tTRI Maximum DO Hold Time
RLe3k
(CS Rising edge to DO
CLe100 pF
90
150
150
ns
TRI-STATE)
tCA Analog
After Address Is Latched
4SCLKa1 ms
sec
Sampling Time
CSeLow
tRDO Maximum DO
RLe30 kX
‘‘TRI-STATE’’ to ‘‘HIGH’’ State
75
150
150
ns
Rise Time
CLe100 pf
‘‘LOW’’ to ‘‘HIGH’’ State
150
300
300
tFDO Maximum DO
RLe30 kX
‘‘TRI-STATE’’ to ‘‘LOW’’ State
75
150
150
ns
Fall Time
CLe100 pf
‘‘HIGH’’ to ‘‘LOW’’ State
150
300
300
CIN Maximum Input
Analog Inputs ANO – AN10 and VREF
11
55
pF
Capacitance
All Others
5
15
Note 1
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when operating
the device beyond its specified operating conditions
Note 2
All voltages are measured with respect to ground
Note 3
Under over voltage conditions (VINk0V and VINlVCC) the maximum input current at any one pin is g5 mA If the voltage at more than one pin exceeds
VCC a 3V the total package current must be limited to 20 mA For example the maximum number of pins that can be over driven at the maximum current level of
g
5 mA is four
Note 4
Total unadjusted error includes offset full-scale linearity multiplexer and hold step errors
Note 5
Two on-chip diodes are tied to each analog input which will forward-conduct for analog input voltages one diode drop below ground or one diode drop
greater than VCC supply Be careful during testing at low VCC levels (45V) as high level analog inputs (5V) can cause this input diode to conduct especially at
elevated temperatures and cause errors for analog inputs near full-scale The spec allows 50 mV forward bias of either diode This means that as long as the
analog VIN does not exceed the supply voltage by more than 50 mV the output code will be correct To achieve an absolute 0 VDC to5VDC input voltage range will
therefore require a minimum supply voltage of 4950 VDC over temperature variations initial tolerance and loading
Note 6
Typicals are at 25 C and represent most likely parametric norm
Note 7
Guaranteed and 100% production tested under worst case condition
Note 8
Guaranteed but not 100% production tested These limits are not used to calculate outgoing quality levels
Note 9
Channel leakage current is measured after the channel selection
Note 10
1 count e VREF 256
Note 11
Human body model 100 pF discharged through a 15 kX resistor
Test Circuits
Leakage Current
TLH5587 – 17
D0 Except ‘‘TRI-STATE’’
TLH5587 – 6
4



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