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PI6CFGL601B Datasheet(PDF) 10 Page - Pericom Semiconductor Corporation

Part # PI6CFGL601B
Description  6-Output Low Power PCIE Gen 1-2-3 Clock Generator
PDF  13 Pages
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Manufacturer  PERICOM [Pericom Semiconductor Corporation]
Direct Link  http://www.pericom.com
Logo PERICOM - Pericom Semiconductor Corporation

PI6CFGL601B Datasheet(HTML) 10 Page - Pericom Semiconductor Corporation

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10
PI6CFGL601B
RevA
01/16/15
PI6CFGL601B
6-Output Low Power PCIE Gen 1-2-3 Clock Generator
All trademarks are property of their respective owners.
Electrical Characteristics–CLK 0.7V Low Power Differential Outputs
T
A = -40~85
o
C; Supply Voltage VDD = 3.3 V +/-10%; VDDO = 1.8V +/-10%, See Test Loads for loading conditions
Symbol
Parameters
Condition
Min. Typ. Max. Units
Trf
Slew rate1,2,3
Scope averaging on
1
4
V/ns
ΔTrf
Slew rate matching1,2,4
Slew rate matching, Scope averaging on
20
%
VHigh
Voltage High1
Statistical measurement on single-ended signal
using oscilloscope math function. (Scope averag-
ing on)
660
850
mV
VLow
Voltage Low1
-150
150
Vmax
Max Voltage1
Measurement on single ended signal using abso-
lute value. (Scope averaging off)
1150
mV
Vmin
Min Voltage1
-300
Vswing
Vswing1,2
Scope averaging off
300
mV
Vcross_abs
Crossing Voltage (abs)1,5
Scope averaging off
300
550
mV
Δ-Vcross
Crossing Voltage (var)1,6
Scope averaging off
140
mV
Notes:
1. Guaranteed by design and characterization, not 100% tested in production. CL = 2pF with RS = 33Ω for Zo = 50Ω (100Ω differential trace impedance).
2. Measured from differential waveform.
3. Slew rate is measured through the Vswing voltage range centered around differential 0V. This results in a +/-150mV window around differential 0V.
4. Matching applies to rising edge rate of Clock / falling edge rate of Clock#. It is measured in a +/-75mV window centered on the average cross point where
Clock rising meets Clock# falling. The median cross point is used to calculate the voltage thresholds the oscilloscope uses for the edge rate calculations.
5. Vcross is defined as voltage where Clock = Clock# measured on a component test board and only applies to the differential rising edge (i.e. Clock rising and
Clock# falling).
6. The total variation of all Vcross measurements in any particular system. Note that this is a subset of V_cross_min/max (V_cross absolute) allowed. The intent is
to limit Vcross induced modulation by setting V_cross_delta to be smaller than V_cross abs.
Electrical Characteristics–Phase Jitter Parameters
T
A = -40~85
o
C; Supply Voltage VDD = 3.3 V +/-10%; VDDO = 1.8V +/-10%, See Test Loads for Loading Conditions
Symbol
Parameters
Condition
Min. Typ.
INDUSTRY
LIMIT
Units
t
jphPCIeG1
Phase Jitter, PCI
Express1,2,3,5
PCIe Gen 1
27
86
ps
(p-p)
t
jphPCIeG2
Phase Jitter, PCI
Express1,2,5
PCIe Gen 2 Low Band
10kHz < f < 1.5MHz
0.5
3
ps
(rms)
PCIe Gen 2 High Band
1.5MHz < f < Nyquist (50MHz)
2.1
3.1
ps
(rms)
t
jphPCIeG3
Phase Jitter, PCI
Express1,2,4,5
PCIe Gen 3
(PLL BW of 2-4MHz, CDR = 10MHz)
0.5
1
ps
(rms)
Notes:
1. Guaranteed by design and characterization, not 100% tested in production.
2. See http://www.pcisig.com for complete specs.
3. Sample size of at least 100k cycles. This figures extrapolates to 108ps pk-pk @ 1M cycles for a BER of 1-12.
4. Calculated from Intel-supplied Clock Jitter Tool.
5. Applies to all different outputs.
15-0018



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