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ADC12451 Datasheet(PDF) 15 Page - National Semiconductor (TI) |
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ADC12451 Datasheet(HTML) 15 Page - National Semiconductor (TI) |
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15 / 18 page ![]() 30 Analog Considerations (Continued) 35 INPUT BYPASS CAPACITORS An external capacitor can be used to filter out any noise due to inductive pickup by a long input lead and will not degrade the accuracy of the conversion result 36 INPUT SOURCE RESISTANCE The analog input can be modeled as shown in Figure 6 External RS will lengthen the time period necessary for the voltage on CREF to settle to within LSB of the analog input voltage With tA e 35 ms RS s 1kX will allow a 5V analog input voltage to settle properly 37 POWER SUPPLIES Noise spikes on the VCC and V b supply lines can cause conversion errors as the comparator will respond to this noise The AD is especially sensitive during the Auto-Zero or -Cal procedures to any power supply spikes Low induc- tance tantalum capacitors of 10 mF or greater paralleled with 01 mF ceramic capacitors are recommended for supply bypassing Separate bypass capacitors should be placed close to the DVCC AVCC and V b pins If an unregulated voltage source is available in the system a separate LM340LAZ-50 voltage regulator for the A-to-D’s VCC (and other analog circuitry) will greatly reduce digital noise on the supply line 38 THE CALIBRATION CYCLE On power up the ADC12451 goes through an Auto-Cal cy- cle which cannot be interrupted Since the power supply reference and clock will not be stable at power up this first calibration cycle will not result in an accurate calibration of the AD A new calibration cycle needs to be started after the power supplies reference and clock have been given enough time to stabilize During the calibration cycle cor- rection values are determined for the offset voltage of the sampled data comparator and any linearity and gain errors These values are stored in internal RAM and used during an analog-to-digital conversion to bring the overall full-scale offset and linearity errors down to the specified limits Full- scale error typically changes g02 LSB over temperature and linearity error changes even less therefore it should be necessary to go through the calibration cycle only once af- ter power up if Auto-Zero is used to correct the zero error change Since Auto-Zero cannot be activated with S H con- version method it may be necessary to do a calibration cy- cle more than once 39 THE AUTO-ZERO CYCLE To correct for any change in the zero (offset) error of the AD the auto-zero cycle can be used It may be necessary to do an auto-zero cycle whenever the ambient temperature changes significantly (See the curve titled ‘‘Zero Error Change vs Ambient Temperature’’ in the Typical Perform- ance Characteristics) A change in the ambient temperature will cause the VOS of the sampled data comparator to change which may cause the zero error of the AD to be greater than g1 LSB An auto-zero cycle will typically main- tain the zero error to g1 LSB or less 40 Dynamic Performance Many applications require the AD converter to digitize ac signals but the standard dc integral and differential nonlin- earity specifications will not accurately predict the AD con- verter’s performance with ac input signals The important specifications for ac applications reflect the converter’s abil- ity to digitize ac signals without significant spectral errors and without adding noise to the digitized signal Dynamic characteristics such as signal-to-noise (SN) signal-to- noiseadistortion ratio (S(NaD)) effective bits full power bandwidth aperture time and aperture jitter are quantitative measures of the AD converter’s capability An AD converter’s ac performance can be measured using Fast Fourier Transform (FFT) methods A sinusoidal wave- form is applied to the AD converter’s input and the trans- form is then performed on the digitized waveform S(NaD) and SN are calculated from the resulting FFT data and a spectral plot may also be obtained Typical values for SN are shown in the table of Electrical Characteristics and spectral plots of S(NaD) are included in the typical per- formance curves The AD converter’s noise and distortion levels will change with the frequency of the input signal with more distortion and noise occurring at higher signal frequencies This can be seen in the S(NaD) versus frequency curves These curves will also give an indication of the full power band- width (the frequency at which the S(NaD) or SN drops 3 dB) TLH11025 – 23 FIGURE 6 Analog Input Equivalent Circuit 15 |
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