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LM181E06 Datasheet(PDF) 21 Page - NXP Semiconductors

Part # LM181E06
Description  SPECIFICATION FOR APPROVAL
PDF  26 Pages
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

LM181E06 Datasheet(HTML) 21 Page - NXP Semiconductors

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Product Specification
21 / 26
LM181E06
Liquid Crystal Display
Ver 0.0
APR.07, 2002
6. Reliability
Environment test condition
{ Result Evaluation Criteria }
There should be no change which might affect the practical display function when the display quality
test is conducted under normal operating condition.
No
Test Item
Conditions
1
High temperature storage test
Ta= 60°C
240hr
2
Low temperature storage test
Ta= -20°C
240hr
3
High temperature operation test
Ta= 50°C 50%RH 240hr
4
Low temperature operation test
Ta= 0°C 240hr
5
Humidity condition operation
20%RH ~ 95%RH
6
Humidity condition storage
5%RH ~ 95%RH
7
Vibration test
(non-operating)
1. Sinusoidal Vibration
1.0G zero to peak.
10 to 500 Hz, 0.5 oct/min sweep rate.
10 to 500, 10Hz, one sweep along each axis.
2. Random Vibration
0.002 G2 /Hz, 10 to 500Hz, normal 1 GRMS.
20 minute for each of the three axis.
8
Shock test
(non-operating)
1. Half sine wave shock :
120G peak, half sine pulse, 2ms pulse duration.
Testing shall consist of one shock in each direction in
each axis, for a total of 6 shock inputs.(1 time)
2. Square wave shock :
30G peak acceleration, 180 inches/sec velocity change.
There shall be one shock in each direction in each axis,
for a total of 6 shock inputs.(1 time)
9
Altitude
storage / shipment
0 - 40,000 feet
10
ESD test
(Non-operation)
Condition : 150pF, 330?
Terminal : 200V
Chassis : 10KV



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