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CLC020 Datasheet(PDF) 12 Page - Texas Instruments

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Part # CLC020
Description  CLC020 SMPTE 259M Digital Video Serializer with Integrated Cable Driver
PDF  20 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

CLC020 Datasheet(HTML) 12 Page - Texas Instruments

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CLC020
SNLS046E – FEBRUARY 2000 – REVISED APRIL 2013
www.ti.com
The Test Out output is intended for monitoring by equipment presenting high impedance loading (>500
Ω). When
monitoring the Lock Detect output, the attached monitoring circuit should present a DC resistance greater than 5
k
Ω so that Lock Detect indicator operation is not affected.
Connect LOCK DETECT to TPG ENABLE for test pattern generator function.
Remove RP1 & RP3 and replace RP2 & RP4 with 50
Ω resistor packs for coax interfacing.
Install RP1-4 when using ribbon cable for input interfacing.
This board is designed for use with TTL power supplies only.
For optional ECL compatible load: R1A = R2A = 187; R1B = R2B = 124.
All resistances & impedances in Ohms. Values with 3 significant digits are 1%; with 2 digits 5%.
Figure 9. SD020EVK Schematic Diagram
MEASURING JITTER
The test method used to obtain the timing jitter value given in the AC Electrical Specification table is based on
procedures and equipment described in SMPTE RP 192-1996. The recommended practice discusses several
methods and indicator devices. An FFT method performed by standard video test equipment was used to obtain
the data given in this data sheet. As such, the jitter characteristics (or jitter floor) of the measurement equipment,
particularly the measurement analyzer, become integral to the resulting jitter value. The method and equipment
were chosen so that the test can be easily duplicated by the design engineer using most standard digital video
test equipment. In so doing, similar results should be achieved. The intrinsic jitter floor of the CLC020's PLL is
approximately 25% of the typical jitter given in the electrical specifications. In production, device jitter is
measured on automatic IC test equipment (ATE) using a different method compatible with that equipment. Jitter
measured using this ATE yields values approximately 50% of those obtained using the video test equipment.
12
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Product Folder Links: CLC020



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