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TLK1201IRCPR Datasheet(PDF) 4 Page - Texas Instruments |
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TLK1201IRCPR Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 25 page ![]() TLK1201RCP, TLK1201IRCP ETHERNET TRANSCEIVERS SLLS506E − AUGUST 2001 − REVISED MAY 2007 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Terminal Functions (Continued) TERMINAL I/O DESCRIPTION NAME NO. I/O DESCRIPTION SIGNAL (continued) RBC0 RBC1 31 30 O Receive byte clock. RBC0 and RBC1 are recovered clocks used for synchronizing the 10-bit output data on RD0−RD9. The operation of these clocks is dependent upon the receive clock mode selected. In the half-rate mode, the 10-bit output data words are valid on the rising edges of RBC0 and RBC1. These clocks are adjusted to half-word boundaries in conjunction with synchronous detect. The clocks are always expanded during data realignment and never slivered or truncated. RBC0 registers bytes 1 and 3 of received data. RBC1 registers bytes 0 and 2 of received data. In the normal rate mode, only RBC0 is valid and operates at 1/10 the serial data rate. Data is aligned to the rising edge. In the DDR mode, only RBC0 is valid and operates at 1/10 the serial data rate. Data is aligned to both the rising and falling edges. RD0−RD9 45, 44, 43, 41, 40, 39, 38, 36, 35, 34 O Receive data. When in TBI mode (MODESEL = low) these outputs carry 10-bit parallel data output from the transceiver to the protocol layer. The data is referenced to terminals RBC0 and RBC1, depending on the receive clock mode selected. RD0 is the first bit received. When in the DDR mode (MODESEL = high) only RD0−RD4 are valid. RD5−RD9 are held low. The 5-bit parallel data is clocked out of the transceiver on the rising edge of RBC0. REFCLK 22 I Reference clock. REFCLK is an external input clock that synchronizes the receiver and transmitter interface (60 MHz to 130 MHz). The transmitter uses this clock to register the input data (TD0−TD9) for serialization. In the TBI mode that data is registered on the rising edge of REFCLK. In the DDR mode, the data is registered on both the rising and falling edges of REFCLK with the most significant bits aligned to the rising edge of REFCLK. RXP RXN 54 52 PECL I Differential input receive. RXP and RXN together are the differential serial input interface from a copper or an optical I/F module. SYNCEN 24 I P/U‡ Synchronous function enable. When SYNCEN is high, the internal synchronization function is activated. When this function is activated, the transceiver detects the K28.5 comma character (0011111 negative beginning disparity) in the serial data stream and realigns data on byte boundaries if required. When SYNCEN is low, serial input data is unframed in RD0 − RD9. SYNC/PASS 47 O Synchronous detect. The SYNC output is asserted high upon detection of the comma pattern in the serial data path. SYNC pulses are output only when SYNCEN is activated (asserted high). In PRBS test mode (PRBSEN=high), SYNC/PASS outputs the status of the PRBS test results (high=pass). TD0−TD9 2−4, 6−9, 11−13 I Transmit data. When in the TBI mode (MODESEL = low) these inputs carry 10-bit parallel data output from a protocol device to the transceiver for serialization and transmission. This 10-bit parallel data is clocked into the transceiver on the rising edge of REFCLK and transmitted as a serial stream with TD0 sent as the first bit. When in the DDR mode (MODESEL = high) only TD0−TD4 are valid. The 5-bit parallel data is clocked into the transceiver on the rising and falling edge of REFCLK and transmitted as a serial stream with TD0 sent as the first bit. TXP TXN 62 61 PECL O Differential output transmit. TXP and TXN are differential serial outputs that interface to a copper or an optical I/F module. TXP and TXN are put in a high-impedance state when LOOPEN is high and are active when LOOPEN is low. TEST ENABLE 28 I P/U‡ When this terminal is low, the device is disabled for Iddq testing. RD0 − RD9, RBCn, TXP, and TXN are high impedance. The pullup and pulldown resistors on any input are disabled. When ENABLE is high, the device operates normally. JTDI 48 I P/U‡ Test data input. IEEE1149.1 (JTAG) JTDO 27 O Test data output. IEEE1149.1 (JTAG) JTMS 55 I P/U‡ Test mode select. IEEE1149.1 (JTAG) † P/D = Internal pulldown ‡ P/U = Internal pullup |
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