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GS8342D06 Datasheet(PDF) 14 Page - GSI Technology |
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GS8342D06 Datasheet(HTML) 14 Page - GSI Technology |
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14 / 30 page ![]() 20% tKHKH VSS – 1.0 V 50% VSS VIH Undershoot Measurement and Timing Overshoot Measurement and Timing 20% tKHKH VDD + 1.0 V 50% VDD VIL Note: Input Undershoot/Overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC. Capacitance oC, f = 1 MHZ, VDD = 1.8 V) Parameter Symbol Test conditions Typ. Max. Unit Input Capacitance CIN VIN = 0 V 4 5 pF Output Capacitance COUT VOUT = 0 V 6 7 pF Clock Capacitance CCLK VIN = 0 V 5 6 pF Note: This parameter is sample tested. Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. Rev: 1.02a 11/2012 14/30 © 2011, GSI Technology GS8342D06/11/20/38BD-550/500/450/400/350 AC Test Conditions Parameter Conditions Input high level 1.25 V Input low level 0.25 V Max. input slew rate 2 V/ns Input reference level 0.75 V Output reference level VDDQ/2 Note: Test conditions as specified with output loading as shown unless otherwise noted. DQ VT = 0.75 V 50 Ω RQ = 250 Ω (HSTL I/O) VREF = 0.75 V AC Test Load Diagram (TA = 25 |
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