AD5162 datasheet(12/20 Pages) AD

12 / 20 page

AD5162

Rev. A | Page 12 of 20

TEST CIRCUITS

Figure 27 through Figure 32 illustrate the test circuits that

define the test conditions used in the product specification

tables.

VMS

DUT

V+

V+ = VDD

1LSB = V+/2N

Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error

(INL, DNL)

NO CONNECT

VMS

DUT

Figure 28. Test Circuit for Resistor Position Nonlinearity Error

(Rheostat Operation; R-INL, R-DNL)

VMS2

VMS1

DUT

IW = VDD/RNOMINAL

RW = [VMS1 – VMS2]/IW

Figure 29. Test Circuit for Wiper Resistance

∆V

MS%

DUT

(

)

V+

∆V

DD%

∆V

VMS

V+ = VDD ± 10%

PSRR (dB) = 20 LOG

PSS (%/%) =

Figure 30. Test Circuit for Power Supply Sensitivity

(PSS, PSSR)

+15V

–15V

2.5V

VOUT

OFFSET

GND

DUT

AD8610

VIN

Figure 31. Test Circuit for Gain vs. Frequency

VCM

ICM

GND

VDD

DUT

NC = NO CONNECT

Figure 32. Test Circuit for Common-Mode Leakage Current

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