ARM28XXT SERIES

(28V Input, Triple Output)

5

2016-07-01

Notes to Group A Test Table

1. Parameter verified during dynamic load regulation tests.

2. Guaranteed for DC to 20 MHz bandwidth. Test conducted using a 20 kHz to 2 MHz bandwidth.

3. Load current is stepped for output under test while other outputs are fixed at half rated load.

4. Each output is measured for all combinations of line and load. Only the minimum and maximum readings for each output are recorded.

5. Load step transition time

10µS.

7. Turn on delay time is tested by application of a logical low to high transition on the enable pin (pin 3) with power present at the input.

8. Subgroups 1 and 4 are performed at +25ºC, subgroups 2 and 5 at -55ºC and subgroups 3 and 6 at +125ºC.

Radiation Performance

The radiation tolerance characteristics inherent in the ARM28XXT converter are based on the results of the ground-up

design effort on the ART2800T program and started with specific radiation design goals. By imposing sufficiently large

margins on those electrical parameters subject to the degrading effects of radiation, appropriate elements were selected

for incorporation into the ART2800T circuit. Known radiation data was utilized for input to PSPICE and Rad SPICE in the

generation of circuit performance verification analyses. Thus, electrical performance capability under all environmental conditions

including radiation was well understood before first application of power to the inputs.

The principal ART2800T design goal was a converter topology, which because of large design margins, had radiation

performance essentially independent of wafer-lot radiation performance variations. Radiation tests on random ART2800T manufacturing

lots provide continued confirmation of the soundness of the design goals as well as justification for the element selection criteria.

To achieve the radiation levels specified for the ARM28XXT, the ART2800T topology is utilized as the basis but lot

assurance testing is utilized as part of the screening process to assure the specified level. Each ARM28XXT converter is

delivered with lot test data at the hybrid level supporting the minimum TID specification. Other radiation specifications

are assured by design and generic data are available on request.

The following table specifies guaranteed minimum radiation exposure levels tolerated while maintaining specification limits.

Radiation Specification Tcase = 25°C

Parameter

Condition

Min

Typ

Max

Unit

Total Ionizing Dose (2 :1 Margin)

MIL-STD-883, Method 1019.4

Operating bias applied during exposure

1,000

kRads (Si)

Heavy Ion

(Single event effects)

BNL Dual Van de Graf Generator

83

Dose Rate

Temporary Saturation

Survival

MIL-STD-883, Method 1021

1E8

1E11

Rads(Si)/sec

Neutron Fluence

MIL-STD-883, Method 1017.2

3E12

IR HiRel currently does not have a DLA certified Radiation Hardness Assurance Program.

Standard Quality Conformance Inspections on ARH28XXXXS Series (Flight Screened)

Inspection

Application

Samples

Group A

Part of screening on each unit

100%

Group B

Each inspection lot

* 5 units

Group C

First inspection lot or following class 1 change

10 units

Group D

In line (Part of element evaluation)

3 units

* Group B quantity for option 2 End of Line QCI. No Group B samples required for Option 1, In-line.