L9660 datasheet(38/49 Pages) STMICROELECTRONICS

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Functional description

L9660

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DocID024714 Rev 2

Bits D8:D7

The definition of the response bits changes as follows based on

diagnostic select

STB/STG bit Definition with MOSI D11:D9=001 (Leakage Test)

STB bit Bit used for indicating leakage to battery.

0 = No leakage to battery

1 = Short to battery / HS Driver test pass

STG bit Bit used for indicating leakage to ground.

0 = No leakage to battery

1 = Short to ground / LS Driver test pass

STB/STG bit Definition with MOSI D11:D9=110 (LS FET)

STB, STG bits see table below

Table 20. Diagnostic selection

Diagnostic

Bits

Current source

active

Comparator or

amplifier

D11

D10

Stop Diagnostic

Short to Battery/Ground and

short between loops

Y (VMRC)

Y (Comp

ISTB/ISTG)

VRESx Diagnostic

Y (Comp VRESx)

High Side Safing Diagnostics

Y (IHSS)

Y (Comp HSS)

Squib Resistance Diagnostics

Y (ISRC/ISINK)

Y (Amply)

High Squib Resistance

Diagnostics

Y (VMRC/ISINK)

Y (Comp IHR)

LS FET test

Y (VMRC)

Y (Comp

ISTB/ISTG)

HS FET test

Y (VMRC)

Y (Comp

ISTB/ISTG)

Table 21. Diagnostic mode LS FET selection

Condition

STB

STG

Test in Process (FT=1); Fault present prior to run test (FP=1); or LS

FET/GNDx open fault (FP=0,FT=0). Only Valid if test is in process

or inactive.

Short to battery occurred during test.

Test Pass if leakage diagnostics did not indicate a short to Gnd.

L9660 Datasheet(PDF) 38 Page - STMicroelectronics

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