HAL501 datasheet(40/44 Pages) ETC

40 / 44 page

HAL5xx

Micronas

5. Application Notes

5.1. Ambient Temperature

Due to the internal power dissipation, the temperature

on the silicon chip (junction temperature TJ) is higher

than the temperature outside the package (ambient tem-

perature TA).

TJ = TA + ∆T

At static conditions, the following equation is valid:

∆T = IDD * VDD * Rth

For typical values, use the typical parameters. For worst

case calculation, use the max. parameters for IDD and

Rth, and the max. value for VDD from the application.

For all sensors, the junction temperature range TJ is

specified. The maximum ambient temperature TAmax

can be calculated as:

TAmax = TJmax – ∆T

5.2. Extended Operating Conditions

All sensors fulfill the electrical and magnetic characteris-

tics when operated within the Recommended Operating

Conditions (see page 7).

Supply Voltage Below 3.8 V

Typically, the sensors operate with supply voltages

above 3 V, however, below 3.8 V some characteristics

may be outside the specification.

Note: The functionality of the sensor below 3.8 V has not

been tested. For special test conditions, please contact

Micronas.

5.3. Start-up Behavior

Due to the active offset compensation, the sensors have

an initialization time (enable time ten(O)) after applying

the supply voltage. The parameter ten(O) is specified in

the Electrical Characteristics (see page 8).

During the initialization time, the output state is not de-

fined and the output can toggle. After ten(O), the output

will be low if the applied magnetic field B is above BON.

The output will be high if B is below BOFF. In case of sen-

sors with an inverted switching behavior (HAL 516 ...

HAL 519), the output state will be high if B > BOFF and low

if B < BON.

For magnetic fields between BOFF and BON, the output

state of the HAL sensor after applying VDD will be either

low or high. In order to achieve a well-defined output

state, the applied magnetic field must be above BONmax,

respectively, below BOFFmin.

5.4. EMC and ESD

For applications with disturbances on the supply line or

radiated disturbances, a series resistor and a capacitor

are recommended (see figures 5–1). The series resistor

and the capacitor should be placed as closely as pos-

sible to the HAL sensor.

Applications with this arrangement passed the EMC

tests according to the product standards DIN 40839.

Note: The international standard ISO 7637 is similar to

the used product standard DIN 40839.

Please contact Micronas for the detailed investigation

reports with the EMC and ESD results.

OUT

GND

1VDD

4.7 nF

VEMC

220

Ω

1.2 k

Ω

20 pF

Fig. 5–1: Test circuit for EMC investigations

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