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LF6197 Datasheet(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # LF6197
Description  160 ns Monolithic Sample-and-Hold Amplifier
PDF  12 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

LF6197 Datasheet(HTML) 4 Page - National Semiconductor (TI)

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Electrical Characteristics (Continued)
Note 1
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur
Note 2
Operating Ratings indicate conditions for which the device is functional but do not guarantee specific performance limits For guaranteed specifications
and test conditions see the Electrical Characteristics The guaranteed specifications apply only for the test conditions listed Some performance characteristics
may degrade when the device is not operated under the listed test conditions
Note 3
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax HJA and the ambient temperature TA The maximum
allowable power dissipation is PD e (TJmax b TA) HJA or the number given in the Absolute Maximum Ratings whichever is lower For this device TJmax e 150 C
and iJA e 125 CW The Power Derating Curve shows the safe thermal operating area for this device
Note 4
Continuous short-circuit operation at elevated ambient temperature can result in exceeding the maximum allowed junction temperature of 150 C
Note 5
Human body model 100 pF capacitor discharged through a 15 kX resistor
Note 6
Typicals are at TA e 25 C and represent the most likely parametric norm
Note 7
Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)
Note 8
Operation at g5V requires that pin 14 be forced to 25V
Note 9
Gain error is calculated from the measured open loop gain
Note 10
The acquisition time of the LF6197 has been measured when the device has been configured as an inverting amplifier with a gain of b1 feedback
resistor of 2 kX feedback capacitor of 1 pF and a total load resistor of 1 kX
Note 11
Hold step is measured with the LF6197 configured as a unity gain follower and input connected to ground A TTL pulse with 4 ns rise and fall times is
applied to the logic input the hold step is dependent on the slew rate of the logic input pulse
Note 12
See test circuit
Figure 1
Note 13
Full power bandwidth is calculated using FPBW e SR(2qVP) where SR is the measured slew rate and VP is the peak voltage
4



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