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SCAN921821 Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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SCAN921821 Datasheet(HTML) 4 Page - National Semiconductor (TI) |
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4 / 11 page ![]() AC Electrical Characteristics Over recommended operating supply and temperature ranges unless otherwise specified. Symbol Parameter Conditions Min Typ Max Units Serializer AC Specifications t LLHT Bus LVDS Low-to-High Transition Time Figure 2, (Note 5) R L = 100 Ω, C L=10pF to GND 0.3 0.4 ns t LHLT Bus LVDS High-to-Low Transition Time 0.3 0.4 ns t DIS DIN (0-17) Setup to TCLK Figure 4, (Note 5) R L = 100 Ω, C L=10pF to GND 1.9 ns t DIH DIN (0-17) Hold from TCLK 0.6 ns t HZD DO ± HIGH to TRI-STATE Delay Figure 5 R L = 100 Ω, C L=10pF to GND 3.9 10 ns t LZD DO ± LOW to TRI-STATE Delay 3.5 10 ns t ZHD DO ± TRI-STATE to HIGH Delay 3.2 10 ns t ZLD DO ± TRI-STATE to LOW Delay 2.4 10 ns t SPW SYNC Pulse Width Figure 7, R L = 100 Ω 5*t TCP 6*t TCP ns t PLD Serializer PLL Lock Time Figure 6, R L = 100 Ω 510*t TCP 1024*t TCP ns t SD Serializer Delay Figure 8 ,R L = 100 Ω t TCP + 2.5 t TCP + 4.5 t TCP + 6.5 ns t SKCC Channel to Channel Skew 70 ps t RJIT Random Jitter Room Temperature, V DD = 3.3V, 66 MHz 6.1 ps (RMS) t DJIT Deterministic Jitter Figure 9, (Note 5) 15 MHz -390 320 ps 66 MHz -60 30 ps 1149.1 (JTAG) AC Specifications f MAX Maximum TCK Clock Frequency C L = 15pF, R L = 500 Ω 25 MHz t S TDI or TMS Setup to TCK,HorL 2.4 ns t H TDI or TMS Hold from TCK, H or L 2.8 ns t W1 TCK Pulse Width, H or L 10 ns t W2 TRST Pulse Width, L 10 ns t REC Recovery Time, TRST to TCK 2ns Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices should be operated at these limits. The table of “Electrical Characteristics” specifies conditions of device operation. Note 2: Typical values are given for VCC = 3.3V and TA = +25˚C. Note 3: Current into device pins is defined as positive. Current out of device pins is defined as negative. Voltages are referenced to ground except VOD, ∆VOD, VTH and VTL which are differential voltages. Note 4: IOZ is measured at each pin. The DOUT pin not under test is floated to isolate the TRI-STATE current flow. Note 5: Guaranteed by Design (GBD) using statistical analysis. www.national.com 4 |
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