ADS1602IPFBT datasheet(2/26 Pages) BURR-BROWN

2 / 26 page

ADS1602

SBAS341B − DECEMBER 2004 − REVISED APRIL 2005

www.ti.com

PACKAGE/ORDERING INFORMATION

For the most current package and ordering information see

the Package Option Addendum located at the end of this

datasheet or visit the TI web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range unless otherwise noted(1)

ADS1602

UNIT

AVDD to AGND

−0.3 to +6

DVDD to DGND

−0.3 to +3.6

IOVDD to DGND

−0.3 to +6

AGND to DGND

−0.3 to +0.3

Input Current

100mA, Momentary

Input Current

10mA, Continuous

Analog I/O to AGND

−0.3 to AVDD + 0.3

Digital I/O to DGND

−0.3 to IOVDD + 0.3

Maximum Junction Temperature

+150

°C

Operating Temperature Range

−40 to +105

°C

Storage Temperature Range

−60 to +150

°C

Lead Temperature (soldering, 10s)

+260

°C

(1) Stresses above these ratings may cause permanent damage.

Exposure to absolute maximum conditions for extended periods

may degrade device reliability. These are stress ratings only, and

functional operation of the device at these or any other conditions

beyond those specified is not implied.

This integrated circuit can be damaged by ESD. Texas

Instruments recommends that all integrated circuits be

handled with appropriate precautions. Failure to observe

proper handling and installation procedures can cause damage.

ADS1602 passes standard 200V machine model and 1.5K CDM

testing. ADS1602 passes 1kV human body model testing (TI Standard

is 2kV).

ESD damage can range from subtle performance degradation to

complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

ADS1602IPFBT Datasheet(PDF) 2 Page - Burr-Brown (TI)

ADS1602IPFBT Datasheet(HTML) 2 Page - Burr-Brown (TI)

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26

Datasheet Download

Link URL