Data Sheet

18

Rev. 1.0

2017-09-14

TLE7268

Dual LIN 2.2 / SAE J2602 Transceiver

General product characteristics

6

General product characteristics

6.1

Absolute maximum ratings

Notes

1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

2. Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are

not designed for continuous repetitive operation.

Table 3

All voltages with respect to ground; positive current flowing into pin; unless otherwise specified

1) Not subject to production test, specified by design

Parameter

Symbol

Values

Unit Note or Test Condition Number

Min. Typ. Max.

Voltages

Battery supply voltage

-0.3 –

40

V

ISO 17987 Param. 11

P_5.1.1

input voltage at BUS1, BUS2

-27 –

40

V

–

P_5.1.2

DifferencevoltagebetweenBUS1

and BUS2

–

40

V

–

P_5.1.14

Logic voltage at EN1, EN2, TxD1,

TxD2, RxD1, RxD2

-0.3 –

6.0

V

–

P_5.1.3

INH voltage

-0.3 –

–

P_5.1.4

Currents

Output current at RxD1, RxD2

0–

15

mA –

P_5.1.5

Output current at INH

-5

–

5

mA –

P_5.1.6

Temperatures

Junction temperature

-40 –

150

°C

–

P_5.1.7

Storage temperature

-55 –

150

°C

–

P_5.1.8

ESD Resistivity

Electrostaticdischarge voltage at

–

8

kV

Human Body Model

2) ESD susceptibility HBM according to ANSI / ESDA / JEDEC JS-001

P_5.1.9

Electrostatic discharge voltage

all other pins

–

2

kV

Human Body Model

(100pF via 1.5 kΩ)2)

P_5.1.10

Electrostatic discharge voltage

corner pins

750

V

3) ESD susceptibility, Charged Device Model “CDM” EIA / JESD 22-C101 or ESDA STM5.3.1

P_5.1.11

Electrostatic discharge voltage

all other pins

500

V

Charged Device Model3) P_5.1.12