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MMRF1314GS Datasheet(PDF) 1 Page - NXP Semiconductors |
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MMRF1314GS Datasheet(HTML) 1 Page - NXP Semiconductors |
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1 / 17 page ![]() MMRF1314H MMRF1314HS MMRF1314GS 1 RF Device Data NXP Semiconductors RF Power LDMOS Transistors High Ruggedness N--Channel Enhancement--Mode Lateral MOSFETs These RF power devices are designed for pulse applications operating at frequencies from 1200 to 1400 MHz. The devices are suitable for use in pulse applications and are ideal for use in high power military and commercial L--Band radar applications. Typical Performance: In 1200–1400 MHz reference circuit, VDD =52 Vdc, IDQ(A+B) = 100 mA Frequency (MHz) Signal Type Pout (W) Gps (dB) ηD (%) 1200 Pulse (128 μsec, 10% Duty Cycle) 1130 Peak 15.5 47.5 1300 1170 Peak 17.2 47.0 1400 1000 Peak 17.0 46.5 Load Mismatch/Ruggedness Frequency (MHz) Signal Type VSWR Pin (W) Test Voltage Result 1400 (1) Pulse (128 μsec, 10% Duty Cycle) > 20:1 at All Phase Angles 31.6 Peak (3 dB Overdrive) 52 No Device Degradation 1. Measured in 1400 MHz production test fixture. Features • Internally input and output matched for broadband operation and ease of use • Device can be used in a single--ended, push--pull or quadrature configuration • Qualified up to a maximum of 52 VDD operation • High ruggedness, handles > 20:1 VSWR • Integrated ESD protection with greater negative gate--source voltage range for improved Class C operation and gate voltage pulsing • Characterized with series equivalent large--signal impedance parameters Typical Applications • Military and commercial L--Band radar systems Document Number: MMRF1314H Rev. 1, 1/2017 NXP Semiconductors Technical Data 1200–1400 MHz, 1000 W PEAK, 52 V AIRFAST RF POWER LDMOS TRANSISTORS MMRF1314H MMRF1314HS MMRF1314GS (Top View) Drain A 31 Figure 1. Pin Connections 42 Drain B Gate A Gate B NI--1230GS--4L MMRF1314GS NI--1230S--4S MMRF1314HS NI--1230H--4S MMRF1314H Note: The backside of the package is the source terminal for the transistor. © 2017 NXP B.V. |
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