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HMC8415LP6GETR Datasheet(PDF) 21 Page - Analog Devices |
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HMC8415LP6GETR Datasheet(HTML) 21 Page - Analog Devices |
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21 / 23 page ![]() Data Sheet HMC8415LP6GE Rev. A | Page 21 of 23 MAKING AVERAGE TO PULSED APPROXIMATIONS To measure RF power, IDD, and PAE accurately in a pulsed manner, use instruments offering pulse triggered measurements. When pulse triggered instruments are not available but simpler instruments with adequate averaging capabilities are, approximations can be made with the understanding that the approximations can result in lower accuracy of measurement. The most common approximations involve measuring the average values of parameters and then adjusting those values to account for the duty cycle of operation. Approximating in this manner can result in errors due to the limited measurement bandwidths of the instruments and/or the inclusion of on/off transients and/or partial periods in the measurement. So that partial periods do not contribute significant errors to the measurements, perform the averaging over a large number of pulse periods. The results of such approximations can vary with the instruments and settings used. Therefore, experimentation can be necessary to achieve credible and repeatable results. When it is not possible to make pulse triggered measurements, the only pulse connection required is the one from the pulse generator to the J1 connector of the pulsor (see Figure 49). Depending on the implementation of the HMC8415LP6GE and the pulsor into customer applications, adjustments of the pulse circuit may be desired if the on and off transitions are accompanied by excessive drain supply ringing. Synchronous with the drain pulses, the VGGxx bias and RFIN signal can also be pulsed. Unless otherwise noted, all measurement data shown within this data sheet was taken using the typical application circuit (see Figure 47) as implemented on the evaluation board (see Figure 50), with the drain bias pulsed at 28 V by the pulsor board (see Figure 48) to achieve the nominal IDQ of 1000 mA at a pulse width of 100 µs, and 10% duty cycle. Operating at different drain voltages or different drain quiescent currents affects performance, as shown in the Typical Performance Characteristics section. For applications having lower power and gain requirements, operation at lower VDDxx and IDQ can help reduce power consumption. Due to thermal considerations, the use of lower duty cycles and shorter pulse widths can sometimes result in improved power and PAE. |
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