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MCP6C04 Datasheet(PDF) 33 Page - Microchip Technology |
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MCP6C04 Datasheet(HTML) 33 Page - Microchip Technology |
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33 / 54 page ![]() 2019 Microchip Technology Inc. DS20006179A-page 33 MCP6C04 4.1.3.2 DC Current Errors Figure 4-3 shows the resistors and currents that change the DC bias point. The input bias currents (IBP, IBM and IBR), together with a circuit’s external input resistances, give an DC error (see Equation 1-2). FIGURE 4-3: DC Bias Resistors and Currents. RSH is set by the design requirements, given the load current (IL). For most applications, RSH would be between 100 µΩ and 1Ω. The DC input offset error due to the input currents is: VOS_IR =VDM –ILRSH =IBM(RSH +RWIM)–IBPRWIP Since these currents do not correlate, minimize the magnitude of each resistance. IBPRIP will dominate in many designs. RWR modifies the gain error and the DC output offset error (VOUT changes IBR): EQUATION 4-5: 4.1.4 AC PERFORMANCE The bandwidth of these parts (fBW) is set internally to either 500 kHz (GDM = 20 or 50) or 390 kHz (GDM = 100). The large signal bandwidth is close to the small signal bandwidth. The slew rate (SR) has little effect on VOUT (a benefit of our Current-mode architecture). The bandwidth at the maximum output swing is called the Full Power Bandwidth (fFPBW). It is limited by the Slew Rate (SR) for many amplifiers, but is close to fBW for these parts. This is a benefit of the Current-mode architecture these parts have. These parts are compensated to have a stable response. For instance, step response overshoot is low. To be stable, VREF must see a low impedance and VOUT must have a low capacitive load (see Figure 4-6 to compensate large capacitive loads). In this data sheet, the AC CMRR is measured at VIP. This is accurate, since VDM is relatively small. 4.1.5 TEMPERATURE PERFORMANCE The input offset voltage’s temperature drift is detailed in Equation 1-6. Other temperature responses are shown in Section 1.3, Specifications and Section 2.0 “Typical Performance Curves”. Since there are three power supply pins (VIP, VDD and VSS), and VIP reaches 52V, power and temperature rise calculations are important. The power dissipated is calculated as follows (IOUT is positive when it flows out of the VOUT pin): EQUATION 4-6: Now we can estimate the junction temperature of the device (see Table 1-4): EQUATION 4-7: 4.1.6 NOISE PERFORMANCE This part is designed to have low input noise voltage density at lower frequencies. The offset correction (Section 4.2.2, Chopping Action) modulates high frequency white noise down to DC; it also modulates low frequency 1/f noise to higher frequencies. The measured input noise voltage density is shown in Figure 2-47. That figure also shows Integrated Input Noise Voltage (Eni, in units of VRMS) between 0 Hz and f (between 0.1 Hz and 100 kHz). The Input Noise Voltage Density (eni) changes with VDM. However, that relationship is a weak one. IBR VDD VSS U1 MCP6C04 Σ VOUT RWR RG RF VHV IL Load RSH IBM IBP RWIM RWIP ΔVREF IBRRWR – = ΔgE RWRGDM – () RF RG + () ⁄ ≈ VOUT VREF ΔVREF + () GDMVDM 1gE ΔgE ++ () + ≈ PTOT PDD PBP POUT ++ = Where: IOUT =(VOUT –VL)/RL PDD =(VDD –VSS)IDD PBP =(VIP –VSS)IBP POUT =(VDD –VOUT)IOUT, IOUT ≥0A =(VSS –VOUT)IOUT, IOUT <0A TJ TA PTOTθJA + = |
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