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MCP6C04 Datasheet(PDF) 33 Page - Microchip Technology

Part # MCP6C04
Description  Zero-Drift, 52V High-Side Current Sense Amplifier
PDF  54 Pages
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Manufacturer  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP6C04 Datasheet(HTML) 33 Page - Microchip Technology

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 2019 Microchip Technology Inc.
DS20006179A-page 33
MCP6C04
4.1.3.2
DC Current Errors
Figure 4-3 shows the resistors and currents that
change the DC bias point. The input bias currents (IBP,
IBM and IBR), together with a circuit’s external input
resistances, give an DC error (see Equation 1-2).
FIGURE 4-3:
DC Bias Resistors and
Currents.
RSH is set by the design requirements, given the load
current (IL). For most applications, RSH would be
between 100 µΩ and 1Ω.
The DC input offset error due to the input currents is:
VOS_IR =VDM –ILRSH
=IBM(RSH +RWIM)–IBPRWIP
Since these currents do not correlate, minimize the
magnitude of each resistance. IBPRIP will dominate in
many designs.
RWR modifies the gain error and the DC output offset
error (VOUT changes IBR):
EQUATION 4-5:
4.1.4
AC PERFORMANCE
The bandwidth of these parts (fBW) is set internally to
either 500 kHz (GDM = 20 or 50) or 390 kHz
(GDM = 100).
The large signal bandwidth is close to the small signal
bandwidth. The slew rate (SR) has little effect on VOUT
(a benefit of our Current-mode architecture).
The bandwidth at the maximum output swing is called
the Full Power Bandwidth (fFPBW). It is limited by the
Slew Rate (SR) for many amplifiers, but is close to fBW
for these parts. This is a benefit of the Current-mode
architecture these parts have.
These parts are compensated to have a stable
response. For instance, step response overshoot is
low. To be stable, VREF must see a low impedance and
VOUT must have a low capacitive load (see Figure 4-6
to compensate large capacitive loads).
In this data sheet, the AC CMRR is measured at VIP.
This is accurate, since VDM is relatively small.
4.1.5
TEMPERATURE PERFORMANCE
The input offset voltage’s temperature drift is detailed in
Equation 1-6. Other temperature responses are shown
in Section 1.3, Specifications and Section 2.0
“Typical Performance Curves”.
Since there are three power supply pins (VIP, VDD and
VSS), and VIP reaches 52V, power and temperature rise
calculations are important.
The power dissipated is calculated as follows (IOUT is
positive when it flows out of the VOUT pin):
EQUATION 4-6:
Now we can estimate the junction temperature of the
device (see Table 1-4):
EQUATION 4-7:
4.1.6
NOISE PERFORMANCE
This part is designed to have low input noise voltage
density at lower frequencies. The offset correction
(Section 4.2.2, Chopping Action) modulates high
frequency white noise down to DC; it also modulates
low frequency 1/f noise to higher frequencies.
The measured input noise voltage density is shown in
Figure 2-47. That figure also shows Integrated Input
Noise Voltage (Eni, in units of VRMS) between 0 Hz and
f (between 0.1 Hz and 100 kHz).
The Input Noise Voltage Density (eni) changes with
VDM. However, that relationship is a weak one.
IBR
VDD
VSS
U1
MCP6C04
Σ
VOUT
RWR
RG
RF
VHV
IL
Load
RSH
IBM
IBP
RWIM
RWIP
ΔVREF
IBRRWR
–
=
ΔgE
RWRGDM
–
() RF RG
+
()
⁄
≈
VOUT
VREF ΔVREF
+
() GDMVDM 1gE ΔgE
++
()
+
≈
PTOT
PDD PBP POUT
++
=
Where:
IOUT =(VOUT –VL)/RL
PDD =(VDD –VSS)IDD
PBP =(VIP –VSS)IBP
POUT =(VDD –VOUT)IOUT, IOUT ≥0A
=(VSS –VOUT)IOUT, IOUT <0A
TJ
TA PTOTθJA
+
=



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