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MCP4716 Datasheet(PDF) 47 Page - Microchip Technology

Part # MCP4716
Description  6-Bit Volatile DAC with Command Code
PDF  70 Pages
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Manufacturer  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP4716 Datasheet(HTML) 47 Page - Microchip Technology

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 2012 Microchip Technology Inc.
DS25154A-page 47
MCP47A1
8.0
APPLICATIONS EXAMPLES
The MCP47A1 family of devices are general purpose,
single-channel voltage output DACs for various
applications where a precision operation with low
power is needed.
The MCP47A1 devices are rail-to-rail output DACs
designed to operate with a VDD range of 1.8V to 5.5V.
The internal output op amplifier is robust enough to
drive
common,
small-signal
loads
directly,
thus
eliminating the cost and size of external buffers for
most applications.
Applications generally suited for the devices are:
• Set Point or Offset Trimming
• Sensor Calibration
• Portable Instrumentation (Battery Powered)
• Motor Control
Application examples include:
•
DC Set Point or Calibration
•
Decreasing Output Step Size
•
Building a “Window” DAC
•
Selectable Gain and Offset Bipolar Voltage
Output
•
Building Programmable Current Source
•
Serial Interface Communication Times
•
Software I2C Interface Reset Sequence
In the design of a system with the MCP47A1 devices,
the following considerations should be taken into
account:
•
Power Supply Considerations (Noise)
•
PCB Area Requirements
•
Connecting to I2C BUS using Pull-Up
Resistors
8.1
DC Set Point or Calibration
A
common
application
for
the
devices
is
a
digitally-controlled set point and/or calibration of
variable parameters, such as sensor offset or slope.
For example, the MCP47A1 provides 64 output steps
over the voltage reference range. If voltage reference is
1.65V, the LSb size is 1.65V / 64, or ~ 25.78 mV.
Applications that need accurate detection of an input
threshold event often need several sources of error
eliminated. Use of comparators and operational
amplifiers (op amps) with low offset and gain error can
help achieve the desired accuracy, but in many
applications, the input source variation is beyond the
designer’s control. If the entire system can be
calibrated after assembly in a controlled environment
(like factory test), these sources of error are minimized,
if not entirely eliminated. Figure 8-1 illustrates this
example circuit. Equation 8-1 shows a quick estimation
of the wiper value given the desired voltage trip (VTRIP)
point.
FIGURE 8-1:
Set Point or Threshold
Calibration.
EQUATION 8-1:
ESTIMATING THE WIPER
VALUE (N) FROM THE
DESIRED VTRIP
VCC+
VCC–
VO
I2C™
2-wire
VREF
MCP47A1
VDD
VOUT
C1
Comp.
VTRIP
VSENSE
VTRIP = VOUT = (N * VS)
( VTRIP - VREF )
Where: VS = VREF / 64
Note: Calculation does not take into account RFS
and RZS resistors of the DAC’s resistor ladder (see
Section 7.1 for additional information).
N =
VS



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