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MCP4716 Datasheet(PDF) 47 Page - Microchip Technology |
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MCP4716 Datasheet(HTML) 47 Page - Microchip Technology |
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47 / 70 page ![]() 2012 Microchip Technology Inc. DS25154A-page 47 MCP47A1 8.0 APPLICATIONS EXAMPLES The MCP47A1 family of devices are general purpose, single-channel voltage output DACs for various applications where a precision operation with low power is needed. The MCP47A1 devices are rail-to-rail output DACs designed to operate with a VDD range of 1.8V to 5.5V. The internal output op amplifier is robust enough to drive common, small-signal loads directly, thus eliminating the cost and size of external buffers for most applications. Applications generally suited for the devices are: • Set Point or Offset Trimming • Sensor Calibration • Portable Instrumentation (Battery Powered) • Motor Control Application examples include: • DC Set Point or Calibration • Decreasing Output Step Size • Building a “Window” DAC • Selectable Gain and Offset Bipolar Voltage Output • Building Programmable Current Source • Serial Interface Communication Times • Software I2C Interface Reset Sequence In the design of a system with the MCP47A1 devices, the following considerations should be taken into account: • Power Supply Considerations (Noise) • PCB Area Requirements • Connecting to I2C BUS using Pull-Up Resistors 8.1 DC Set Point or Calibration A common application for the devices is a digitally-controlled set point and/or calibration of variable parameters, such as sensor offset or slope. For example, the MCP47A1 provides 64 output steps over the voltage reference range. If voltage reference is 1.65V, the LSb size is 1.65V / 64, or ~ 25.78 mV. Applications that need accurate detection of an input threshold event often need several sources of error eliminated. Use of comparators and operational amplifiers (op amps) with low offset and gain error can help achieve the desired accuracy, but in many applications, the input source variation is beyond the designer’s control. If the entire system can be calibrated after assembly in a controlled environment (like factory test), these sources of error are minimized, if not entirely eliminated. Figure 8-1 illustrates this example circuit. Equation 8-1 shows a quick estimation of the wiper value given the desired voltage trip (VTRIP) point. FIGURE 8-1: Set Point or Threshold Calibration. EQUATION 8-1: ESTIMATING THE WIPER VALUE (N) FROM THE DESIRED VTRIP VCC+ VCC– VO I2C™ 2-wire VREF MCP47A1 VDD VOUT C1 Comp. VTRIP VSENSE VTRIP = VOUT = (N * VS) ( VTRIP - VREF ) Where: VS = VREF / 64 Note: Calculation does not take into account RFS and RZS resistors of the DAC’s resistor ladder (see Section 7.1 for additional information). N = VS |
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