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LTM2887 Datasheet(PDF) 24 Page - Analog Devices

Part # LTM2887
Description  7.5kVRMS SPI/Digital or I2C 關Module Isolator with Transformer Driver
PDF  30 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

LTM2887 Datasheet(HTML) 24 Page - Analog Devices

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LTM2810
24
Rev. A
For more information www.analog.com
APPLICATIONS INFORMATION
RF, Magnetic Field Immunity
TheisolatorµModuletechnologyusedwithintheLTM2810
hasbeenindependentlyevaluated,andsuccessfullypassed
the RF and magnetic field immunity testing requirements
per European Standard EN 55024, in accordance with the
following test standards:
EN 61000-4-3 Radiated, radio-frequency, electromag-
netic field immunity
EN 61000-4-8 Powerfrequencymagneticfieldimmunity
EN 61000-4-9 Pulsed magnetic field immunity
Tests were performed using an unshielded test card de-
signed per the data sheet PCB layout recommendations.
Specific limits per test are detailed in Table 4.
Table 4. EMC Immunity Tests
TEST
FREQUENCY
FIELD STRENGTH
EN 61000-4-3 Annex D
80MHz to 1GHz
10V/m
1.4MHz to 2GHz
3V/m
2GHz to 2.7GHz
1V/m
EN 61000-4-8 Level 4
50Hz and 60Hz
30A/m
EN 61000-4-8 Level 5
60Hz
100A/m*
EN 61000-4-9 Level 5
Pulse
1000A/m
* Non IEC method.
PCB Layout
The high integration of the LTM2810 makes PCB layout
very simple. However, to optimize its electrical isolation
characteristics and EMI performance, some layout con-
siderations are necessary.
• Input and output supply decoupling is not required,
since these components are integrated within the pack-
age. An additional bulk capacitor with a value of 6.8µF
to 22µF with 1Ω to 3Ω of ESR is recommended. The
high ESR of this capacitor reduces board resonances
and minimizes voltage spikes caused by hot plugging
of the supply voltage. For EMI sensitive applications, an
additional low ESL ceramic capacitor of 1µF to 4.7µF,
placed as close to the power and ground terminals as
possible, is recommended. Alternatively, a number of
smaller value parallel capacitors may be used to reduce
ESL and achieve the same net capacitance.
• Do not place copper on the PCB between the inner col-
umns of pads. This area must remain open to withstand
the rated isolation voltage.
• The use of solid ground planes for GND and GND2
is recommended for non-EMI critical applications to
optimize signal fidelity, and minimize RF emissions
due to uncoupled PCB trace conduction. The drawback
of using ground planes where EMI is of concern, is
the creation of a dipole antenna structure which can
radiate differential voltages formed between GND and
GND2. If ground planes are used, it is recommended
to minimize their area, and use contiguous planes as
any openings or splits can exacerbate RF emissions.
• For large ground planes a small capacitance (≤ 330pF)
from GND to GND2, either discrete or embedded within
the substrate, provides a low impedance current return
path for the module parasitic capacitance, minimizing
anyhighfrequencydifferentialvoltagesandsubstantially
reducing radiated emissions. Discrete capacitance will
notbeaseffectiveduetoparasiticESL.Inaddition,volt-
age rating, leakage, and clearance must be considered
for component selection. Embedding the capacitance
withinthePCBsubstrateprovidesanearidealcapacitor
and eliminates component selection issues; however,
the PCB must be 4 layers. Care must be exercised in
applying either technique to ensure the voltage rating
of the barrier is not compromised.
• In applications without an embedded PCB substrate
capacitance, a slot may be added between the logic
side and isolated side device pins. The slot extends the
creepage path between terminals on the PCB side, and
may reduce leakage caused by PCB contamination. The
slot should be placed in the middle of the device and
extend beyond the package perimeter.



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