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ADC14155EB Datasheet(PDF) 15 Page - National Semiconductor (TI) |
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ADC14155EB Datasheet(HTML) 15 Page - National Semiconductor (TI) |
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15 / 19 page ![]() Applications Information (Continued) TABLE 1. Input to Output Relationship V IN+ V IN− Binary Output 2’s Complement Output V CM −VREF/2 V CM +VREF/2 00 0000 0000 0000 10 0000 0000 0000 Negative Full-Scale V CM −VREF/4 V CM +VREF/4 01 0000 0000 0000 11 0000 0000 0000 V CM V CM 10 0000 0000 0000 00 0000 0000 0000 Mid-Scale V CM +VREF/4 V CM −VREF/4 11 0000 0000 0000 01 0000 0000 0000 V CM +VREF/2 V CM −VREF/2 11 1111 1111 1111 01 1111 1111 1111 Positive Full-Scale 2.1.2 Driving the Analog Inputs The V IN+ and the VIN− inputs of the ADC14155 have an internal sample-and-hold circuit which consists of an analog switch followed by a switched-capacitor amplifier. The ana- log inputs are connected to the sampling capacitors through NMOS switches, and each analog input has parasitic capaci- tances associated with it. When the clock is high, the converter is in the sample phase. The analog inputs are connected to the sampling capacitor through the NMOS switches, which causes the capacitance at the analog input pins to appear as the pin capacitance plus the internal sample and hold circuit capacitance (ap- proximately 9 pF). While the clock level remains high, the sampling capacitor will track the changing analog input volt- age. When the clock transitions from high to low, the con- verter enters the hold phase, during which the analog inputs are disconnected from the sampling capacitor. The last volt- age that appeared at the analog input before the clock transition will be held on the sampling capacitor and will be sent to the ADC core. The capacitance seen at the analog input during the hold phase appears as the sum of the pin capacitance and the parasitic capacitances associated with the sample and hold circuit of each analog input (approxi- mately 6 pF). Once the clock signal transitions from low to high, the analog inputs will be reconnected to the sampling capacitor to capture the next sample. Usually, there will be a difference between the held voltage on the sampling capaci- tor and the new voltage at the analog input. This will cause a charging glitch that is proportional to the voltage difference between the two samples to appear at the analog input pin. The input circuitry must be fast enough to allow the sampling capacitor to fully charge before the clock signal goes high again, as incomplete settling can degrade the SFDR perfor- mance. A single-ended to differential conversion circuit is shown in Figure 4. A transformer is preferred for high frequency input signals. Terminating the transformer on the secondary side provides two advantages. First, it presents a real broadband impedance to the ADC inputs and second, it provides a common path for the charging glitches from each side of the differential sample-and-hold circuit. One short-coming of using a transformer to achieve the single-ended to differential conversion is that most RF trans- formers have poor low frequency performance. A differential amplifier can be used to drive the analog inputs for low frequency applications. The amplifier must be fast enough to settle from the charging glitches on the analog input resulting from the sample-and-hold operation before the clock goes high and the sample is passed to the ADC core. The SFDR performance of the converter depends on the external signal conditioning circuity used, as this affects how quickly the sample-and-hold charging glitch will settle. An external resistor and capacitor network as shown in Figure 4 should be used to isolate the charging glitches at the ADC input from the external driving circuit and to filter the wide- band noise at the converter input. These components should be placed close to the ADC inputs because the analog input of the ADC is the most sensitive part of the system, and this is the last opportunity to filter that input. For Nyquist appli- cations the RC pole should be at the ADC sample rate. The ADC input capacitance in the sample mode should be con- sidered when setting the RC pole. For wideband undersam- pling applications, the RC pole should be set at about 1.5 to 2 times the maximum input frequency to maintain a linear delay response. 2.1.3 Input Common Mode Voltage The input common mode voltage, V CM, should be in the range of 1.4V to 1.6V and be a value such that the peak excursions of the analog signal do not go more negative than ground or more positive than 2.6V. It is recommended to use V RM (pin 45) as the input common mode voltage. 2.2 Reference Pins The ADC14155 is designed to operate with an internal 1.0V reference, or an external 1.0V reference, but performs well with external reference voltages in the range of 0.8V to 1.2V. The internal 1.0 Volt reference is the default condition when no external reference input is applied to the V REF pin. If a voltage in the range of 0.8V to 1.2V is applied to the V REF pin, then that voltage is used for the reference. The V REF pin should always be bypassed to ground with a 0.1 µF capaci- tor close to the reference input pin. Lower reference voltages will decrease the signal-to-noise ratio (SNR) of the ADC14155. Increasing the reference voltage (and the input signal swing) beyond 1.2V may degrade THD for a full-scale input, especially at higher input frequencies. It is important that all grounds associated with the reference voltage and the analog input signal make connection to the ground plane at a single, quiet point to minimize the effects of noise currents in the ground path. The Reference Bypass Pins (V RP,VRM, and VRN) are made available for bypass purposes. All these pins should each be bypassed to ground with a 0.1 µF capacitor. A 0.1 µF and a 10 µF capacitor should be placed between the V RP and VRN pins, as shown in Figure 4. This configuration is necessary to avoid reference oscillation, which could result in reduced SFDR and/or SNR. V RM may be loaded to 1mA for use as a temperature stable 1.5V reference. The remaining pins should not be loaded. Smaller capacitor values than those specified will allow faster recovery from the power down mode, but may result in degraded noise performance. Loading any of these pins, other than V RM, may result in performance degradation. The nominal voltages for the reference bypass pins are as follows: V RM = 1.5 V www.national.com 15 |
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