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ADC14155EB Datasheet(PDF) 15 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # ADC14155EB
Description  14-Bit, 155 MSPS, 1.1 GHz Bandwidth A/D Converter
PDF  19 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

ADC14155EB Datasheet(HTML) 15 Page - National Semiconductor (TI)

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Applications Information (Continued)
TABLE 1. Input to Output Relationship
V
IN+
V
IN−
Binary Output
2’s Complement Output
V
CM −VREF/2
V
CM +VREF/2
00 0000 0000 0000
10 0000 0000 0000
Negative Full-Scale
V
CM −VREF/4
V
CM +VREF/4
01 0000 0000 0000
11 0000 0000 0000
V
CM
V
CM
10 0000 0000 0000
00 0000 0000 0000
Mid-Scale
V
CM +VREF/4
V
CM −VREF/4
11 0000 0000 0000
01 0000 0000 0000
V
CM +VREF/2
V
CM −VREF/2
11 1111 1111 1111
01 1111 1111 1111
Positive Full-Scale
2.1.2 Driving the Analog Inputs
The V
IN+ and the VIN− inputs of the ADC14155 have an
internal sample-and-hold circuit which consists of an analog
switch followed by a switched-capacitor amplifier. The ana-
log inputs are connected to the sampling capacitors through
NMOS switches, and each analog input has parasitic capaci-
tances associated with it.
When the clock is high, the converter is in the sample phase.
The analog inputs are connected to the sampling capacitor
through the NMOS switches, which causes the capacitance
at the analog input pins to appear as the pin capacitance
plus the internal sample and hold circuit capacitance (ap-
proximately 9 pF). While the clock level remains high, the
sampling capacitor will track the changing analog input volt-
age. When the clock transitions from high to low, the con-
verter enters the hold phase, during which the analog inputs
are disconnected from the sampling capacitor. The last volt-
age that appeared at the analog input before the clock
transition will be held on the sampling capacitor and will be
sent to the ADC core. The capacitance seen at the analog
input during the hold phase appears as the sum of the pin
capacitance and the parasitic capacitances associated with
the sample and hold circuit of each analog input (approxi-
mately 6 pF). Once the clock signal transitions from low to
high, the analog inputs will be reconnected to the sampling
capacitor to capture the next sample. Usually, there will be a
difference between the held voltage on the sampling capaci-
tor and the new voltage at the analog input. This will cause a
charging glitch that is proportional to the voltage difference
between the two samples to appear at the analog input pin.
The input circuitry must be fast enough to allow the sampling
capacitor to fully charge before the clock signal goes high
again, as incomplete settling can degrade the SFDR perfor-
mance.
A single-ended to differential conversion circuit is shown in
Figure 4. A transformer is preferred for high frequency input
signals. Terminating the transformer on the secondary side
provides two advantages. First, it presents a real broadband
impedance to the ADC inputs and second, it provides a
common path for the charging glitches from each side of the
differential sample-and-hold circuit.
One short-coming of using a transformer to achieve the
single-ended to differential conversion is that most RF trans-
formers have poor low frequency performance. A differential
amplifier can be used to drive the analog inputs for low
frequency applications. The amplifier must be fast enough to
settle from the charging glitches on the analog input resulting
from the sample-and-hold operation before the clock goes
high and the sample is passed to the ADC core.
The SFDR performance of the converter depends on the
external signal conditioning circuity used, as this affects how
quickly the sample-and-hold charging glitch will settle. An
external resistor and capacitor network as shown in Figure 4
should be used to isolate the charging glitches at the ADC
input from the external driving circuit and to filter the wide-
band noise at the converter input. These components should
be placed close to the ADC inputs because the analog input
of the ADC is the most sensitive part of the system, and this
is the last opportunity to filter that input. For Nyquist appli-
cations the RC pole should be at the ADC sample rate. The
ADC input capacitance in the sample mode should be con-
sidered when setting the RC pole. For wideband undersam-
pling applications, the RC pole should be set at about 1.5 to
2 times the maximum input frequency to maintain a linear
delay response.
2.1.3 Input Common Mode Voltage
The input common mode voltage, V
CM, should be in the
range of 1.4V to 1.6V and be a value such that the peak
excursions of the analog signal do not go more negative than
ground or more positive than 2.6V. It is recommended to use
V
RM (pin 45) as the input common mode voltage.
2.2 Reference Pins
The ADC14155 is designed to operate with an internal 1.0V
reference, or an external 1.0V reference, but performs well
with external reference voltages in the range of 0.8V to 1.2V.
The internal 1.0 Volt reference is the default condition when
no external reference input is applied to the V
REF pin. If a
voltage in the range of 0.8V to 1.2V is applied to the V
REF
pin, then that voltage is used for the reference. The V
REF pin
should always be bypassed to ground with a 0.1 µF capaci-
tor close to the reference input pin. Lower reference voltages
will decrease the signal-to-noise ratio (SNR) of the
ADC14155. Increasing the reference voltage (and the input
signal swing) beyond 1.2V may degrade THD for a full-scale
input, especially at higher input frequencies.
It is important that all grounds associated with the reference
voltage and the analog input signal make connection to the
ground plane at a single, quiet point to minimize the effects
of noise currents in the ground path.
The Reference Bypass Pins (V
RP,VRM, and VRN) are made
available for bypass purposes. All these pins should each be
bypassed to ground with a 0.1 µF capacitor. A 0.1 µF and a
10 µF capacitor should be placed between the V
RP and VRN
pins, as shown in Figure 4. This configuration is necessary to
avoid reference oscillation, which could result in reduced
SFDR and/or SNR. V
RM may be loaded to 1mA for use as a
temperature stable 1.5V reference. The remaining pins
should not be loaded.
Smaller capacitor values than those specified will allow
faster recovery from the power down mode, but may result in
degraded noise performance. Loading any of these pins,
other than V
RM, may result in performance degradation.
The nominal voltages for the reference bypass pins are as
follows:
V
RM = 1.5 V
www.national.com
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